A multi-element amorphous oxide semiconductor thin film and a thin film transistor thereof
A technology of amorphous oxide and thin-film transistors, which is applied in the direction of transistors, semiconductor devices, electrical components, etc., can solve the problems that restrict the development of Si-based TFTs, strong photosensitivity of the channel layer, and unstable electrical properties, etc., and achieve enhanced visible light stability Sex, high visible light transmittance, and the effect of excellent device performance
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Embodiment 1
[0027] Embodiment 1: Amorphous ZnGaSnGeO thin film and thin film transistor
[0028] The magnetron sputtering method is used to grow an amorphous ZnGaSnGeO thin film at room temperature with high-purity ZnGaSnGeO ceramic sheet as the target material, which is used as the channel layer. In addition, glass is used as the substrate, Al is used as the gate, source and drain, and SiO 2 As the insulating layer, an amorphous ZnGaSnGeO thin film transistor is prepared.
[0029] The amorphous ZnGaSnGeO film grown at room temperature was tested for its structure, electrical and optical properties. The test results are as follows: the film is amorphous, with a thickness of 10-100nm and a uniform distribution of components; the band gap at room temperature is 3.5-4.5 eV, with Type conductive properties; visible light transmittance is above 95%.
[0030] The prepared amorphous ZnGaSnGeO thin film transistor was tested for its electrical performance, and the test results were: the switchi...
Embodiment 2
[0031] Embodiment 2: Amorphous ZnGaSnGeInO thin film and thin film transistor
[0032] Using the magnetron sputtering method, the high-purity ZnGaSnGeInO ceramic sheet is used as the target material, and the amorphous ZnGaSnGeInO thin film is grown at room temperature, which is used as the channel layer. With glass as the substrate, Al as the gate, source and drain, SiO 2 As an insulating layer, an amorphous ZnGaSnGeInO thin film transistor is prepared.
[0033]The amorphous ZnGaSnGeInO film grown at room temperature was tested for its structure, electrical and optical properties. The test results are: the film is amorphous, with a thickness of 10-100nm and a uniform distribution of components; the band gap at room temperature is 3.3-4.2 eV, with n Type conductive properties; visible light transmittance is above 94%.
[0034] The prepared amorphous ZnGaSnGeInO thin film transistor was tested for its electrical performance, and the test results were: the switching current rat...
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Abstract
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