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A multi-element amorphous oxide semiconductor thin film and a thin film transistor thereof

A technology of amorphous oxide and thin-film transistors, which is applied in the direction of transistors, semiconductor devices, electrical components, etc., can solve the problems that restrict the development of Si-based TFTs, strong photosensitivity of the channel layer, and unstable electrical properties, etc., and achieve enhanced visible light stability Sex, high visible light transmittance, and the effect of excellent device performance

Inactive Publication Date: 2018-12-11
ZHEJIANG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] At present, the channel layer material of TFT in industrial production is mainly amorphous silicon ( a -Si) and low temperature polysilicon (LTPS), but a -Si TFT has low mobility (~2 cm 2 / Vs), it is difficult to drive displays larger than 90 inches, and based on polysilicon ( p -Si) technology TFT although high mobility (~100 cm 2 / Vs), but the uniformity of the device is poor, the electrical performance is unstable, and the production cost is high, which limits its application.
At the same time, Si is a semiconductor with an indirect band gap and narrow band gap. It is opaque in the visible light region, and the pixel aperture ratio cannot reach 100%. In order to obtain sufficient brightness, it is necessary to increase the light intensity of the light source, thereby increasing the power.
In addition, the channel layer of Si-based semiconductor material has strong photosensitivity, and a mask plate is required, which also seriously affects the aperture ratio.
These shortcomings restrict the development of Si-based TFTs
[0004] In addition, organic semiconductor thin film transistors (OTFTs) have also been studied more, but the stability of OTFTs is not high, and the mobility is relatively low (~1 cm 2 / Vs), which is a big limitation for its practical application

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0027] Embodiment 1: Amorphous ZnGaSnGeO thin film and thin film transistor

[0028] The magnetron sputtering method is used to grow an amorphous ZnGaSnGeO thin film at room temperature with high-purity ZnGaSnGeO ceramic sheet as the target material, which is used as the channel layer. In addition, glass is used as the substrate, Al is used as the gate, source and drain, and SiO 2 As the insulating layer, an amorphous ZnGaSnGeO thin film transistor is prepared.

[0029] The amorphous ZnGaSnGeO film grown at room temperature was tested for its structure, electrical and optical properties. The test results are as follows: the film is amorphous, with a thickness of 10-100nm and a uniform distribution of components; the band gap at room temperature is 3.5-4.5 eV, with Type conductive properties; visible light transmittance is above 95%.

[0030] The prepared amorphous ZnGaSnGeO thin film transistor was tested for its electrical performance, and the test results were: the switchi...

Embodiment 2

[0031] Embodiment 2: Amorphous ZnGaSnGeInO thin film and thin film transistor

[0032] Using the magnetron sputtering method, the high-purity ZnGaSnGeInO ceramic sheet is used as the target material, and the amorphous ZnGaSnGeInO thin film is grown at room temperature, which is used as the channel layer. With glass as the substrate, Al as the gate, source and drain, SiO 2 As an insulating layer, an amorphous ZnGaSnGeInO thin film transistor is prepared.

[0033]The amorphous ZnGaSnGeInO film grown at room temperature was tested for its structure, electrical and optical properties. The test results are: the film is amorphous, with a thickness of 10-100nm and a uniform distribution of components; the band gap at room temperature is 3.3-4.2 eV, with n Type conductive properties; visible light transmittance is above 94%.

[0034] The prepared amorphous ZnGaSnGeInO thin film transistor was tested for its electrical performance, and the test results were: the switching current rat...

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Abstract

The invention discloses a multicomponent amorphous oxide semiconductor thin film and a thin film transistor, wherein the amorphous oxide semiconductor comprises at least four metal elements and an oxygen element, has an amorphous structure, a band gap of 3.3 to 4.5 eV at room temperature, a thin film thickness of 10 to 100 nm, and a visible light transmittance of more than 94%. The metal element is preferably Zn, In, Sn, Ga, Cu, Ge, Cd, Ag, Au, Pb, Bi, Sb. The multicomponent amorphous oxide semiconductor thin films can be prepared by magnetron sputtering. Thin film transistors (TFTs) fabricated with this channel layer have remarkable field effect characteristics. The switching current ratio is on the order of 107, and the field effect mobility can reach 30-50cm2 / Vs or even higher.

Description

technical field [0001] The invention relates to an amorphous oxide semiconductor thin film, in particular to a multi-component amorphous oxide semiconductor thin film and a thin film transistor. Background technique [0002] Thin film transistor (TFT) is one of the core technologies in the field of microelectronics, especially display engineering. Regardless of the active matrix liquid crystal display (AMLCD), which is absolutely dominant in the current advanced display market, or the AMOLED (active matrix organic light-emitting diode display), which represents the future trend of flexible display, TFT devices occupy a large part of the pixel drive unit. key position. In addition, TFT devices have been widely researched and applied in biosensing, ultraviolet search and other fields. Therefore, it is of great significance to research and develop TFT devices. The most important component of TFT is its channel layer material, and the research on TFT also focuses on the resea...

Claims

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Application Information

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IPC IPC(8): H01L29/24H01L29/786
CPCH01L29/247H01L29/78693H01L29/78696
Inventor 吕建国陆波静
Owner ZHEJIANG UNIV
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