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Metal film layer deposition method and device

A technology of metal film layer and deposition method, which is applied in the direction of metal material coating process, coating, ion implantation plating, etc., can solve the problem of deterioration of LED chip electrical and optical properties, affecting the quantum efficiency of the active layer, and damage to the GaN surface structure and other issues to achieve the effect of improving yield, excellent electrical and optical properties, and reducing damage

Active Publication Date: 2019-01-15
BEIJING NAURA MICROELECTRONICS EQUIP CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] However, because the metal film layer is in direct contact with the GaN epitaxial layer in the LED flip-chip process, when the power of the sputtering source is high, the energy of the emitted particles is relatively large, which will inevitably cause damage to the structure of the GaN surface layer during deposition.
Once the damage is formed, it will first affect the quantum efficiency of the active layer, and then lead to the deterioration of the ohmic contact effect between the epitaxial layer and the metal film layer. The final result is the deterioration of the electrical and optical properties of the LED chip, and the yield rate is not high. defect

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  • Metal film layer deposition method and device
  • Metal film layer deposition method and device

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Embodiment 1

[0030] This embodiment provides a metal film layer deposition method for depositing a metal film layer on an epitaxial layer on a substrate surface by a magnetron sputtering deposition method, such as figure 2 As shown, the method includes: step S101: within a preset time, apply radio frequency power to the target, and deposit a metal buffer layer on the epitaxial layer. Step S102: Applying DC power to the target until a metal film layer with a predetermined thickness is deposited on the epitaxial layer.

[0031] Wherein, the preset time is the time required for depositing a metal buffer layer with a predetermined thickness during the process of depositing and forming the metal film layer. In the LED flip-chip process, the epitaxial layer is made of materials such as gallium nitride (GaN). The entire epitaxial layer on the LED chip needs to be in direct contact with the metal film layer, and the surface of the epitaxial layer will be directly bombarded by sputtering particle...

Embodiment 2

[0043] This embodiment provides a metal film layer deposition equipment, such as Figure 5 As shown, it includes a deposition chamber 6 and a target 7 arranged on the top of the deposition chamber 6, and also includes a radio frequency power source 8, a direct current power source 9 and a first switching module 10, and the radio frequency power source 8 and the direct current power source 9 are connected The first switching module 10, the first switching module 10 is connected to the target material 7, and the first switching module 10 is used to switch to the radio frequency power source 8 to load the radio frequency power to the target material 7 when depositing the metal buffer layer; when the deposition of the metal buffer layer is completed Afterwards, the DC power source 9 is switched to apply DC power to the target 7 .

[0044] Wherein, the radio frequency power source 8 is loaded onto the target 7 through the first matcher 13 .

[0045] By setting the RF power source ...

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Abstract

The invention provides a metal film layer deposition method and device. The method is characterized in that a metal film layer is deposited on an epitaxial layer on the surface of a substrate by a magneto-sputtering deposition method. The method comprises the steps of loading radio-frequency power to a target material within a preset time; depositing a metal buffering layer on the epitaxial layer;and loading DC power to the target material until the metal film layer is deposited in preset thickness on the epitaxial layer. According to the metal film layer deposition method, the radio-frequency power is loaded to the target material within the preset time while starting deposition, and the negative bias on the target material can be obviously reduced under the same input power; and as thevoltage of the target material decreases, the damage of sputtered particles to the epitaxial layer on the surface of the substrate in the metal film layer deposition process is reduced. Therefore, good ohmic contact is realized between the epitaxial layer and the metal film layer, and as a result, the yield of an LED chip is increased; the DC power is loaded to the target material in subsequent steps, thus the deposition rate of the metal film layer can be increased, and as a result, the productivity of the LED chip is improved.

Description

technical field [0001] The invention relates to the technical field of semiconductor technology, in particular to a metal film deposition method and metal film deposition equipment. Background technique [0002] The LED chip flip-chip process has obvious advantages over the traditional front-mount process in terms of chip brightness, light output efficiency, heat dissipation performance and reliability. Gaining importance. Compared with the traditional process, the application of the metal film layer in the flip chip process is more and more extensive, the types of metals involved are increased, and the ratio of the metal film area to the total chip area is also increased. Therefore, the role of the metal film in the flip-chip process is very important, and as an important means of metal film preparation, the magnetron sputtering physical deposition method has become an indispensable method for the preparation of the metal film layer in the LED flip-chip process. [0003] ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): C23C14/35C23C14/18
CPCC23C14/185C23C14/35Y02P70/50
Inventor 何中凯荣延栋刘菲菲夏威丁培军
Owner BEIJING NAURA MICROELECTRONICS EQUIP CO LTD