Metal film layer deposition method and device
A technology of metal film layer and deposition method, which is applied in the direction of metal material coating process, coating, ion implantation plating, etc., can solve the problem of deterioration of LED chip electrical and optical properties, affecting the quantum efficiency of the active layer, and damage to the GaN surface structure and other issues to achieve the effect of improving yield, excellent electrical and optical properties, and reducing damage
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Embodiment 1
[0030] This embodiment provides a metal film layer deposition method for depositing a metal film layer on an epitaxial layer on a substrate surface by a magnetron sputtering deposition method, such as figure 2 As shown, the method includes: step S101: within a preset time, apply radio frequency power to the target, and deposit a metal buffer layer on the epitaxial layer. Step S102: Applying DC power to the target until a metal film layer with a predetermined thickness is deposited on the epitaxial layer.
[0031] Wherein, the preset time is the time required for depositing a metal buffer layer with a predetermined thickness during the process of depositing and forming the metal film layer. In the LED flip-chip process, the epitaxial layer is made of materials such as gallium nitride (GaN). The entire epitaxial layer on the LED chip needs to be in direct contact with the metal film layer, and the surface of the epitaxial layer will be directly bombarded by sputtering particle...
Embodiment 2
[0043] This embodiment provides a metal film layer deposition equipment, such as Figure 5 As shown, it includes a deposition chamber 6 and a target 7 arranged on the top of the deposition chamber 6, and also includes a radio frequency power source 8, a direct current power source 9 and a first switching module 10, and the radio frequency power source 8 and the direct current power source 9 are connected The first switching module 10, the first switching module 10 is connected to the target material 7, and the first switching module 10 is used to switch to the radio frequency power source 8 to load the radio frequency power to the target material 7 when depositing the metal buffer layer; when the deposition of the metal buffer layer is completed Afterwards, the DC power source 9 is switched to apply DC power to the target 7 .
[0044] Wherein, the radio frequency power source 8 is loaded onto the target 7 through the first matcher 13 .
[0045] By setting the RF power source ...
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Abstract
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