Analysis device and method for directly measuring trace aluminum, silicon, phosphorus, sulphur and chlorine contents in sample

Abstract

The invention relates to an analysis device and method for directly measuring trace aluminum, silicon, phosphorus, sulphur and chlorine contents in a sample. The device comprises an X ray fluorescenceanalyzer unit (200), a charging unit (100), a sample cup (300) and a control unit, wherein the fluorescence analyzer unit (200) comprises a sample testing cavity (203) capable of carrying out gas filling; the charging unit (100) can controllably carry out air inflation and air exhaust on the sample testing cavity (203); and the control unit controls the analysis device, carries out integration and statistics on collected data, draws a work curve, and carries out calibration and other processing to obtain the contents of each element, including aluminum, silicon, phosphorus, sulphur and chlorine in the tested sample in one time. The analysis device has the advantages that the sample does not need to be subjected to preliminary treatment, and the analysis device is suitable for solid and liquid samples and has the characteristics of being nondestructive, direct, quick, high in sensitivity, low in use cost, convenient in field measurement and the like.

Description

technical field [0001] The invention relates to the technical field of element analysis and detection in samples containing aluminum, silicon, phosphorus, sulfur and chlorine in the environment and petrochemical industry, and in particular to an analytical instrument for directly measuring the content of trace aluminum, silicon, phosphorus, sulfur and chlorine in samples and analysis methods. Background technique [0002] Aluminum, silicon, phosphorus, sulfur, chlorine and other elements belong to the category of light elements in the X-ray detection method. The characteristic X-ray energy is relatively low, and the attenuation range in the air is large, which is greatly affected by the test conditions. In ordinary energy dispersive X-ray fluorescence spectroscopy, because the test light path is exposed to the atmospheric environment, part of the light element signals emitted by the light tube and the sample will be absorbed by the air, reducing the intensity of the spectrum...

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Problems solved by technology

The problems of the above method are: 1) the sample pretreatment is complicated, the operation is cumbersome, and it takes a long time; 2) there are many kinds of analytical reagents used, which require high technical requirements for the operation; 3) the analysis process requires water, heating devices, and fume hoods. and other laboratory equipment; 4) the generation of waste gas, waste water, etc. will cause secondary pollution discharge

[0004] In addition, when using X-ray fluorescence instrument method to test the content of sulfur and phosphorus in the test samples, most of the test samples are samples with high element content, such as catalysts, coal, and iron powder; The sulfur element instrument is only designed for oil products, with a relatively small scope of application and a single function, and does not consider some factors that affect the stability of the test results in the actual use process, such as bubbles inside the liquid, helium cost, and sample testing. Residual air in the cavity, constant temperature conditions, etc.

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