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Method for measuring content of quantum dot surface ligand and quantum dot ink preparing method

A technology of surface ligands and measurement methods, applied in the analysis of materials, instruments, etc., can solve problems such as low pixel resolution, uneven panel quality, difficult dissolution of quantum dots, etc., to achieve reliable quality assurance, strong operability, and applicable wide-ranging effect

Active Publication Date: 2019-06-25
TCL CORPORATION
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

If there are too few ligands on the surface of the quantum dots, the quantum dots are not easy to dissolve in the ink solvent, so inkjet printing cannot be performed
If the surface ligand exchange rate of different batches of quantum dots is different, the solubility, drying rate and coffee ring effect of the quantum dot ink will also be different, which will affect the quality of the light-emitting layer film, which directly leads to the printing of the panel. Uneven quality, low pixel resolution, turn-on voltage, uneven photoelectric efficiency, etc.

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0046] Determine the relative content of the characteristic element S in the surface ligand of the standard particle CdZnSe / CdZnSe / ZnSe quantum dots (the surface ligand is octylthiol) as ω 1 . Take standard particles, stick conductive adhesive or double-sided adhesive paper on the sample holder, sprinkle the standard particles evenly on the sample holder, coat a layer of Pt conductive film, the coating time is 2 min, and then place the standard particles on the sample holder. Observed in a scanning electron microscope. Set the magnification to 500 times, select the standard particle concentration area for analysis, and the size of the analysis area is 5*5um 2, in the energy spectrum analyzer, the content data of each element contained in the standard particles in the selected analysis area is collected to obtain the content curve of each element, and the Cd, Zn, Se and S elements in the element content curve are calibrated respectively, The relative content of each element w...

Embodiment 2

[0049] 1. Determine the relative content of the characteristic element P in the surface ligand of the standard particle CdZnSe / ZnS quantum dot (the surface ligand is octadecylphosphoric acid) as ω 1 .

[0050] Take standard particles, stick conductive adhesive or double-sided adhesive paper on the sample holder, sprinkle the standard particles evenly on the sample holder, coat a layer of Au conductive film, the coating time is 5 minutes, and then place the standard particles on the sample holder. Observe in the scanning electron microscope, set the magnification to 1000 times, analyze the standard particle concentration area, the size of the analysis area is 8*8um 2 , use the energy spectrum analyzer to collect the content data of each element contained in the standard particles in the selected analysis area, and obtain the content curve of each element, and perform Cd, Zn, Se, S and P elements in the element content curve respectively For calibration, the content of P elemen...

Embodiment 3

[0055] 1. Determine the relative content of the characteristic element N in the surface ligand of the standard particle CdS / CdZnS / CdZnS / ZnS quantum dots (the surface ligand is oleylamine) as ω 1 .

[0056] Take the standard particles, stick the conductive adhesive or double-sided adhesive paper on the sample holder, sprinkle the standard particles evenly on the sample holder, coat a layer of Au conductive film, the coating time is 10 min, put the standard particles on the scanning Observe in the electron microscope, set the magnification to 1500 times, select the standard particle concentration area for analysis, and the size of the analysis area is 20*20 um 2 , use the energy spectrum analyzer to collect the content data of each element contained in the standard particles in the selected analysis area, obtain the content curve of each element, and calibrate the standard particles Cd, Zn, Se, S and N in the element content curve , according to the integrated area of ​​each el...

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PUM

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Abstract

The invention provides a method for measuring the content of quantum dot surface ligand and a quantum dot ink preparing method. When the method is used for preparing quantum dot ink, the uniformity ofquantum dot ink quality can be ensured, the consistency of the solubility, drying rates and coffee ring effects of different batches of quantum dot ink is guaranteed, and the pixel resolution and uniformity of the lighting voltages and photoelectric efficiency of the quantum dot display panel are improved.

Description

technical field [0001] The invention relates to the technical field of quantum dot inks, in particular to a method for measuring ligand content on the surface of quantum dots and a preparation method for quantum dot inks. Background technique [0002] Quantum dots refer to semiconductor nanocrystals whose geometric size is smaller than their excitonic Bohr radius. Quantum dots have great potential applications in the fields of biomedicine, environmental energy, and lighting display due to their excellent optical properties such as absorption bandwidth, narrow fluorescence emission band, high quantum efficiency, and good photostability. Compared with liquid crystal display and organic light-emitting display, the display technology based on quantum dot luminescence has been highly valued by the display industry in recent years. Quantum dot luminescence has a wider color gamut, higher color purity, simpler structure, and higher stability. It is a new generation display technol...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N15/00
Inventor 覃辉军叶炜浩杨一行
Owner TCL CORPORATION
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