Unlock instant, AI-driven research and patent intelligence for your innovation.

A vertical structure of mgzno/zno solar-blind detector

A detector and hexagonal phase technology, applied in the field of solar-blind detectors, which can solve problems such as limiting the detection performance of solar-blind detectors

Active Publication Date: 2022-07-12
广东光钛领先新材料有限公司
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, due to the lattice fit, the MgZnO system has the problem of structural phase separation under high Mg composition, which limits its detection performance in solar blind detection.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A vertical structure of mgzno/zno solar-blind detector
  • A vertical structure of mgzno/zno solar-blind detector
  • A vertical structure of mgzno/zno solar-blind detector

Examples

Experimental program
Comparison scheme
Effect test

preparation example Construction

[0024] A third aspect of the present invention provides a method for preparing the vertical detection device, including the steps of substrate pretreatment, substrate preheating, deposition, cooling, photolithography, evaporation, and photoresist removal; preferably, the The preparation method of the vertical detection device includes the steps of substrate pretreatment, substrate preheating, deposition, cooling, photolithography, evaporation and photoresist removal.

[0025] In one embodiment, the substrate pretreatment process is to sequentially clean the ZnO substrate with acetone, ethanol and deionized water, and then perform surface treatment under oxygen plasma; preferably, the substrate pretreatment process is to clean the ZnO substrate with The bottom is sequentially cleaned with acetone, ethanol and deionized water for 5 to 15 minutes, and then subjected to surface treatment under oxygen plasma for 10 to 30 seconds; more preferably, the substrate pretreatment process i...

Embodiment 1

[0038] Embodiment 1 of the present invention provides a vertical detection device, which uses a ZnO single crystal substrate as an electrode material, and further includes a Ti / Au electrode, the thickness of the Ti electrode is 20 nm, and the thickness of the Au electrode is 100 nm;

[0039] The preparation method of the vertical detection device comprises the steps of substrate pretreatment, substrate preheating, and using Mg 0.3 Zn 0.7 O deposition, cooling, photolithography, evaporation and the steps of removing photoresist with acetone;

[0040] The substrate pretreatment process is to sequentially clean the ZnO substrate with acetone, ethanol and deionized water for 10 min, and then perform surface treatment under oxygen plasma for 20 s;

[0041] The substrate preheating process is: 5.0×10 in the deposition chamber -8 Under the Torr vacuum degree, the temperature is gradually increased to 700 °C until the vacuum degree of the deposition chamber returns to 10 -6 Torr or...

Embodiment 2

[0046] Embodiment 2 of the present invention provides a vertical detection device, which uses a ZnO single crystal substrate as an electrode material, and further includes a Ti / Au electrode, the thickness of the Ti electrode is 25 nm, and the thickness of the Au electrode is 110 nm;

[0047] The preparation method of the vertical detection device comprises the steps of substrate pretreatment, substrate preheating, and using Mg 0.3 Zn 0.7 O deposition, cooling, photolithography, evaporation and the steps of removing photoresist with acetone;

[0048] The substrate pretreatment process is to sequentially clean the ZnO substrate with acetone, ethanol and deionized water for 15 min, and then perform surface treatment under oxygen plasma for 30 s;

[0049] The preheating process of the substrate is: 5.5×10 in the deposition chamber -8 Under the Torr vacuum degree, the temperature is gradually increased to 800 °C until the vacuum degree of the deposition chamber returns to 10 -6 ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
thicknessaaaaaaaaaa
thicknessaaaaaaaaaa
wavelengthaaaaaaaaaa
Login to View More

Abstract

The invention relates to the related technical field of solar blind detectors, and more particularly, the invention provides a vertical MgZnO / ZnO heterojunction solar blind detector with ZnO single crystal as a conductive substrate and a preparation method thereof. A first aspect of the present invention provides a hexagonal phase solar-blind bandgap MgZnO thin film, the preparation raw material is Mg x Zn y O, x+y=1, 0.25≤x≤0.45, 0.75≤y≤0.55.

Description

technical field [0001] The invention relates to the related technical field of solar blind detectors, and more particularly, the invention provides a vertical MgZnO / ZnO heterojunction solar blind detector with ZnO single crystal as a conductive substrate and a preparation method thereof. Background technique [0002] Solar blind detection can achieve a high signal-to-noise ratio, and it is widely used in missile warning, fire alarm, high-voltage corona monitoring, ozone hole monitoring, and ultraviolet local communication. Traditional photoelectric vacuum detection devices mainly use mature photomultiplier tubes as the core technology, but they are huge in size, high in operating voltage and expensive. Solid-state detection devices are based on semiconductor materials and have the characteristics of miniaturization, low voltage, and easy integration. At present, silicon-based semiconductor detectors are the most mature, but their ultraviolet intrinsic quantum efficiency is ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01L31/0296H01L31/109H01L31/18
CPCH01L31/02966H01L31/109H01L31/1832Y02P70/50
Inventor 童潇
Owner 广东光钛领先新材料有限公司