Fluorescence lifetime measurement mode based on successive comparison method
A technology of fluorescence lifetime and measurement method, applied to the field of CMOS imaging, can solve problems such as limiting the imaging frame rate of image sensors, and achieve the effect of reducing the amount of effective data, saving output bandwidth, and reducing bandwidth pressure
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[0018] The pulse light source described in the present invention can use the near-infrared light source of wavelength at 700nm-900nm, and photodetector can adopt The single-electron avalanche diode array, the analog domain comparator can be composed of a five-tube comparator and a CD4051 multi-channel selector, and the whole circuit can be based on -Manufactured by CMOS process, all measurement time T is set to 5ns, each exposure time Set to 50ps. The pulsed laser irradiating the sample starts at the same time as the system exposure, and the pulsed laser irradiating the sample is not longer than 50 ps. After the entire measurement period is over, a more accurate fluorescence lifetime measurement result can be obtained.
[0019] For example, we use a light source with a wavelength of 900nm to excite the sample, and the sample is labeled with 4',6-diamidino-2-phenylindole. The irradiation time of the excitation light source to the sample is 50 ps, and each exposure cycle...
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