Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method for preparing silicon carbide epitaxy substrate at low temperature

A silicon carbide and silicon carbide layer technology, which is applied in semiconductor/solid-state device manufacturing, electrical components, circuits, etc., can solve problems such as hindering the development and application of silicon carbide epitaxial substrates, affecting later use, and large internal stress inside the substrate

Inactive Publication Date: 2020-07-10
QINGDAO JIAEN SEMICON
View PDF0 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Silicon carbide epitaxial substrates are generally prepared at high temperatures. For example, chemical vapor deposition (CVD) technology needs to be prepared at about 2000°C, high-temperature sublimation method needs to be prepared at about 2400°C, and liquid phase epitaxy method needs to be prepared at about 1600°C. These The preparation method may have a large internal stress inside the substrate due to the high temperature, which will affect the later use; and the thickness of the prepared substrate is generally thick, with an average thickness of more than 20 μm, which hinders the development of silicon carbide epitaxial substrates. development application

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0045] S1. A silicon carbide single crystal structure is selected as a substrate, and the thickness of the substrate is 160 μm.

[0046] S2. Polish the upper surface of the single crystal structure, and coat the surface with a silicon carbide layer with a thickness of 40 μm; the roughness value of the polished single crystal surface is Ra0.04.

[0047] S3. Heating the whole structure, the heating temperature is controlled at 800° C., the pressure inside the heating reactor is set at 150 mbar, and the heating time is 3 minutes.

[0048] S4, pass hydrogen chloride (HCl) into the structure after step S3 heating, assist H 2 , SF 6 and O 2 For etching, hydrogen chloride, H 2 with (SF 6 and O 2 ) with a mixing ratio of 3:2:1, SF 6 with O 2 The flow ratio was 0.010%.

[0049] S5. Perform photocatalysis on the upper surface of the structure while etching step S4, using CO 2 Laser and the diameter of the beam (spot) is 400 μm.

[0050] S6, performing laser pulse impact on the...

Embodiment 2

[0053] S1. A silicon carbide single crystal structure is selected as the substrate, and the thickness of the substrate is 170 μm.

[0054] S2. Polish the upper surface of the single crystal structure, and coat the surface with a silicon carbide layer with a thickness of 50 μm; the roughness value of the polished single crystal surface is Ra0.03.

[0055] S3. Heating the whole structure, the heating temperature is controlled at 1000° C., the pressure inside the heating reactor is set at 80 mbar, and the heating time is 2 min.

[0056] S4, pass hydrogen chloride (HCl) into the structure after step S3 heating, assist H 2 , SF 6 and O 2 For etching, hydrogen chloride, H 2 with (SF 6 and O 2 ) with a mixing ratio of 3:2:1, SF 6 with O 2 The flow ratio was 0.010%.

[0057] S5. Perform photocatalysis on the upper surface of the structure while etching step S4, using CO 2 Laser and the diameter of the beam (spot) is 300 μm.

[0058] S6, performing laser pulse impact on the u...

Embodiment 3

[0061] S1. A silicon carbide single crystal structure is selected as a substrate, and the thickness of the substrate is 180 μm.

[0062] S2. Polish the upper surface of the single crystal structure, and coat the surface with a silicon carbide layer with a thickness of 30 μm; the roughness value of the polished single crystal surface is Ra0.02.

[0063] S3. Heating the whole structure, the heating temperature is controlled at 900° C., the pressure inside the heating reactor is set at 120 mbar, and the heating time is 3 minutes.

[0064] S4, pass hydrogen chloride (HCl) into the structure after step S3 heating, assist H 2 , SF 6 and O 2 For etching, hydrogen chloride, H 2 with (SF 6 and O 2 ) with a mixing ratio of 3:2:1, SF 6 with O 2 The flow ratio was 0.010%.

[0065] S5. Perform photocatalysis on the upper surface of the structure while etching step S4, using CO 2 Laser and the diameter of the beam (spot) is 300 μm.

[0066] S6, performing laser pulse impact on the...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
thicknessaaaaaaaaaa
thicknessaaaaaaaaaa
thicknessaaaaaaaaaa
Login to View More

Abstract

The invention provides a method for preparing an ultrathin silicon carbide epitaxy substrate at low temperature. The method comprises the following steps: S1, coating a silicon carbide layer on the surface of a base to obtain a first structure body; S2, heating the first structur body to 800-1000 DEG C to obtain a second structural body; S3, simultaneously carrying out etching and illumination catalysis on the surface of the heated silicon carbide layer in the second structural body to obtain a third structural body, the etching gas being hydrogen chloride, H2, SF6 and O2; S4, performing laserpulse impact on the surface of the silicon carbide layer obtained after etching and illumination catalysis in the third structural body to obtain a fourth structural body; and S5, carrying out post-processing on the fourth structural body to obtain the silicon carbide epitaxy substrate. According to the method, the silicon carbide layer is subjected to illumination catalysis matched with etchingof hydrogen chloride, H2, SF6 and O2, so that the activity of the substrate is accelerated, and low-temperature rapid fluidization can be realized; and laser pulse impact enables impurities on the surface of the substrate to be removed quickly, and the thickness of the substrate is reduced.

Description

technical field [0001] The invention belongs to the technical field of silicon carbide epitaxial substrates, in particular to a method for preparing a silicon carbide epitaxial substrate at low temperature. Background technique [0002] Silicon carbide epitaxial wafer refers to the regular arrangement of silicon carbide material molecules under certain conditions and directional growth on the epitaxial substrate. [0003] At present, the commonly used epitaxial substrate is a silicon carbide epitaxial substrate. Silicon carbide epitaxial substrates are generally prepared at high temperatures. For example, chemical vapor deposition (CVD) technology needs to be prepared at about 2000°C, high-temperature sublimation method needs to be prepared at about 2400°C, and liquid phase epitaxy method needs to be prepared at about 1600°C. These The preparation method may have a large internal stress inside the substrate due to the high temperature, which will affect the later use; and t...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/02
CPCH01L21/02529H01L21/02617H01L21/02664
Inventor 王丕龙王新强潘庆波
Owner QINGDAO JIAEN SEMICON
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products