Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A joint monitoring method for key parameters in elastic optical networks

A technology of elastic optical network and key parameters, which is applied in neural learning methods, biological neural network models, image data processing, etc., can solve problems such as poor robustness, few monitoring parameters, and low recognition accuracy, and achieve good robustness, The effect of many monitoring parameters and high recognition accuracy

Active Publication Date: 2022-07-01
LIAOCHENG UNIV
View PDF8 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] Aiming at the above-mentioned deficiencies in the prior art, the present invention discloses a joint monitoring method for key parameters in an elastic optical network, in order to solve the problems of few monitoring parameters, low recognition accuracy and poor robustness existing in the existing method

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A joint monitoring method for key parameters in elastic optical networks
  • A joint monitoring method for key parameters in elastic optical networks
  • A joint monitoring method for key parameters in elastic optical networks

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0051] In this embodiment, aiming at the problem of baud rate, modulation format identification and optical performance joint monitoring of EON system, a method for baud rate, modulation format identification and optical performance joint monitoring based on Radon transform and multi-task neural network is proposed. , the specific technical process is as follows figure 1 shown. The method first uses a coherent receiver to complete the photoelectric conversion and analog-to-digital conversion of the dual-polarization high-order modulation format signal, and then performs digital signal processing on the signal, such as IQ orthogonalization, CD compensation and CMA equalization, etc. The signal is converted into the corresponding constellation diagram and then digital image preprocessing and Radon transform are performed in turn. Finally, the obtained Radon transformed image is sent to the multi-task neural network for multi-parameter joint identification and monitoring, so as t...

Embodiment 2

[0080] In this embodiment, a simulation system is established based on VPI Transmission Maker Optical System 9.3 and KerasLibrary machine learning library to verify the performance of the method for joint monitoring of key parameters in an elastic optical network. Figure 8 Shown is the block diagram of the 14 / 28GBaud PDM-EON transmission simulation system used for the demonstration. First, the optical transmitter generates a pseudo-random binary sequence of length 2 15 -1 of various EON modulation format signals, including 14 / 28GBaud PDM-QPSK, 14 / 28GBaud PDM-8QAM, 14 / 28GBaud PDM-16QAM, 14 / 28GBaud PDM-32QAM, 14 / 28GBaud PDM-64QAM, etc. Erbium fiber amplifiers and variable optical attenuators adjust the optical signal-to-noise ratio (range 10-28dB in 1dB steps), and then use a CD simulator to add a certain residual dispersion to the link (range 0-300ps / nm) , the step size is 50ps / nm), and the system uses the polarization mode dispersion simulator to adjust the DGD of the fiber ...

Embodiment 3

[0087] In this example, in order to further verify the performance of this method, we also constructed a 14 / 28 GBaud coherent optical transmission experimental system. First, digital signal preprocessing is performed on the transmitted signal in an arbitrary waveform generator (AWG, Keysight M8195A), including bit-symbol mapping, pulse shaping with a roll-off factor of 0.75, transmitter predistortion processing, etc., and the pseudo-random bit sequence is set for 2 15 -1. After digital-to-analog conversion with a sampling rate of 65GS / s per channel and an analog bandwidth of 25GHz, the AWG outputs 4 channels of 14 / 28GBaud QPSK / 16QAM / 32QAM RF signals, which are sent to a polarization multiplexing-IQ modulator. In addition, the system uses two external cavity lasers with a line width of about 100KHz as the emission laser and the local oscillator laser, and the center wavelength is set at 1550nm. After that, the optical signal output by the transmitter is sent into the optical ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a method for joint monitoring of key parameters in an elastic optical network (EON), comprising the following steps: S1. In the EON system, photoelectric conversion and analog-to-digital conversion are performed on a dual-polarization high-order modulation format signal through a coherent receiver. , perform digital signal preprocessing on the converted signal, and generate a signal constellation diagram according to the preprocessed signal; S2, perform digital image preprocessing on the generated signal constellation diagram; S3, perform Radon on the preprocessed signal constellation diagram Transform to obtain a corresponding three-primary color image; S4, according to the acquired three-primary color image, realize joint identification and monitoring of multiple key parameters through a multi-task neural network model. The method of the invention is based on Radon transform and multi-task neural network, and can intelligently, quickly and stably identify or monitor five key parameters or performance indicators of optical signals; High precision and good robustness.

Description

technical field [0001] The invention belongs to the technical field of optical fiber communication, and in particular relates to a method for joint monitoring of key parameters in an elastic optical network. Background technique [0002] In order to meet the ever-increasing capacity demand of global international interconnection protocol traffic and further improve the spectrum utilization efficiency of optical fiber communication systems, since 2008, scholars have proposed an elastic optical network (EON) architecture based on coherent reception, which adopts a more refined spectrum grid. Grid and bandwidth variable transceivers, adaptively changing a variety of transmitter parameters (such as modulation format, baud rate, number of sub-carriers, etc.), providing "just enough" spectrum scheduling for each connection requirement to meet dynamically changing traffic need. Compared with the existing dense wavelength division multiplex (DWDM) system, the spectral efficiency of...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H04B10/079H04Q11/00G06K9/62G06N3/04G06N3/08G06T7/13G06T7/136
CPCH04B10/0793H04B10/07953H04B10/0795H04Q11/0062G06N3/08G06T7/13G06T7/136G06T2207/10024G06T2207/20081G06T2207/20084H04Q2011/0083G06N3/047G06N3/045G06F18/2415
Inventor 许恒迎周唐磊唐雪王志国毕岩峰白成林杨立山孙伟斌赵如清李保堃于新阔
Owner LIAOCHENG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com