Method for detecting electric field effect of quantum dots
A technology of electric field effect and quantum dots, which is applied in the direction of measuring electricity, measuring electrical variables, measuring devices, etc., can solve the problems of long measurement preparation time, high cost, low degree of utilization, etc., and achieves simple structure, reduced detection cost, and easy production. Effect
Pending Publication Date: 2022-03-04
ZHEJIANG UNIV OF TECH
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Abstract
The invention discloses a method for detecting the electric field effect of quantum dots. The method comprises the following steps: firstly, manufacturing a detection chip, wherein two parallel electrodes are arranged on a substrate made of a transparent material; directly coating the quantum dot solution on the surface of the chip between the two electrodes; exciting light emitted by the laser source is gathered together through the collecting lens and is vertically emitted into the quantum dot solution coating of the chip; the positive electrode and the negative electrode of the power supply are respectively connected with the two pins, and an electric field is loaded to the chip for rapidly detecting the quantum dot electric field effect through the two electrodes; exciting light penetrating through the chip is collected by a collecting lens, and the absorption spectral line of the quantum dots to incident light is measured on the back surface of the chip through a spectrograph, so that the electric field effect of the quantum dots is obtained. According to the method, the detection chip is simple in structure and easy to manufacture, and the chip can be recycled, so that the detection cost is reduced, and the measurement efficiency is improved.
Application Domain
Electronic circuit testingElectrostatic field measurements
Technology Topic
Optical spectrometerCondensing lens +8
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Example Embodiment
PUM
Property | Measurement | Unit |
Length | 1.0 ~ 1.5 | mm |
Width | 0.2 ~ 0.3 | mm |
Height | 0.02 ~ 0.1 | mm |
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