Planar salient point type technique for packaging intergrate circuit or discrete component

A planar bump-type, discrete component technology, used in electrical components, circuits, electrical solid devices, etc., can solve the problems of poor sole coplanarity, ability to affect solderability, poor contact, etc., and achieve electrical transmission rate. Fast, product quality assurance, the effect of improving heat dissipation

Active Publication Date: 2006-02-01
长电科技管理有限公司
View PDF0 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] 2. Chemical adhesive film: due to the penetrating etching method, it will cause overflow during the encapsulation process
[0005] 3. Pollution: Because of the use of chemical tape, the adhesive of the film is easily vaporized due to high temperature in various high-temperature processes, and indirectly pollutes or covers the surface of the chip's pressing area and the wiring area, often causing wiring Instability of ability
[0009] B. Because of the fear of a large amount of rework after flashing, I dare not use a large encapsulation pressure. As a result, the plastic encapsulation compound is loose, the water absorption rate is increased, and the density is reduced, which seriously increases the production cost and yield cost;
[0010] C. The part of the bottom output pin of the four-sided surface mount type package is at the same height as the surface of the plastic package or even recessed. During the surface mount process, there will be a problem of poor contact due to poor coplanarity of the soles of the feet; at the same time, due to The outer pin is sunken in the plane of the plastic package, air will remain in the sunken during surface mount operation, and the contact will be broken after the high-temperature air expands;
[0011] D. Because the output pin and the plastic package are on the same plane or even recessed, it is easy to cause the solder paste on the surface of the protruding pin to connect to ea

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Planar salient point type technique for packaging intergrate circuit or discrete component
  • Planar salient point type technique for packaging intergrate circuit or discrete component
  • Planar salient point type technique for packaging intergrate circuit or discrete component

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0052] The integrated circuit or discrete component planar bump type packaging process of the present invention consists of the following procedures:

[0053] 1) Substrate - see figure 1 , take a piece of metal substrate 1 with an appropriate thickness. The material of the metal substrate 1 can be changed according to the functions and characteristics of the chip, for example: nickel-iron alloy, pure copper or copper alloy.

[0054]2) Applied dry film - see figure 2 , affix dry film layers 2 and 3 on both sides of the metal substrate to protect the subsequent etching process.

[0055] 3) Remove part of the dry film - see image 3 , correspondingly remove part of the dry film on both sides of the metal substrate 1, and prepare to form base islands and pins on the metal substrate 1, in order to expose the area on the upper layer of the substrate that needs to be metallized later.

[0056] 4) Metallized layer - see Figure 4 , plate the required metal layers 4.1, 4.2, 5.1,...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention includes following technical steps: pasting dry film layer on both sides of metal base plate; removing part of dry film layer for preparing basic island and pins to be formed; plating metal layer at place, where basic island and pins are to be formed, on both sides, then removing remanent dry film layer on front face; carrying out half etching so as to form concave half etched area including basic island and pins, and removing remanent dry film layer on back face; embedding chip on metal layer of basic island on front face, making metal wire, enveloping plastic package, printing at front face; etching remanent partial metal at half etching area, and pasting rubber film onto plastic package and incising. Features are: good weldability, low cost, high adaptability, flexible to arrange multiple chips, and avoiding infiltration of material of plastic package.

Description

Technical field: [0001] The invention relates to a planar bump packaging process for integrated circuits or discrete components. It belongs to the technical field of packaging of integrated circuits or discrete components. Background technique: [0002] The traditional ultra-thin leadless packaging process for integrated circuits or discrete components, the package type is a four-sided leadless surface mount package, and the array assembly is cut into a single unit. Its substrate type is lead frame type. It mainly has the following deficiencies: [0003] 1. Lead frame: The lead frame is made by penetrating etching. [0004] 2. Chemical adhesive film: because of the penetrating etching method, it will cause overflow during the encapsulation process. [0005] 3. Pollution: Because of the use of chemical tape, the adhesive of the film is easily vaporized due to high temperature in various high-temperature processes, and indirectly pollutes or covers the surface of the chip'...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): H01L21/50
CPCH01L24/97H01L2224/32245H01L2224/45124H01L2224/45139H01L2224/45144H01L2224/45147H01L2224/48091H01L2224/48247H01L2224/73265H01L2224/92247H01L2224/97H01L2924/14H01L2924/181H01L2924/00014H01L2924/00012H01L2924/00
Inventor 王新潮于燮康梁志忠谢洁人陶玉娟葛海波王达
Owner 长电科技管理有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products