2D levelness measuring method and apparatus thereof

A technology for levelness measurement and displacement measurement, which is used in measuring devices, height/level measurement, measuring instruments, etc., and can solve the problems of inability to achieve two-dimensional levelness measurement, high excitation current stability, and small excitation frequency drift. Reliable data, increased refraction angle, and improved measurement accuracy

Inactive Publication Date: 2007-04-18
SUZHOU UNIV
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Problems solved by technology

The magnetic fluid level sensor can be divided into two types: bubble type and differential transformer type. The bubble type replaces the liquid in the ancient bubble level with magnetic fluid. The magnetic circuit of the coil is located at the horizontal position. The movement of the bubble during measurement will cause the inductance of the coil The level sensor with this structure has ideal sensitivity and response speed, but the measurement range is narrow, the linearity is not good, and the measurement of two-dimensional level cannot be realized
The differential transformer magnetic fluid level sensor uses quartz tube or aluminosilicate glass as the "skeleton" of the differential transformer, uses the magnetic fluid as the "magnetic core", and winds the "excitation" and "detection" windings on the "skeleton", respectively. When the sensor is in a non-horizontal position, the magnetic fluid flows down, which is equivalent to the displacement of the magnetic core and the induced electromotive force in the detection winding. Therefore, it can be sensitive to the horizontal position, but the disadvantage is that the excitation current requires high stability and excitation frequency. The drift is small, the use environment is strict, and because its output signal is an analog voltage signal, it is susceptible to interference

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  • 2D levelness measuring method and apparatus thereof
  • 2D levelness measuring method and apparatus thereof
  • 2D levelness measuring method and apparatus thereof

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Embodiment 1

[0024] Referring to accompanying drawing 3, in this embodiment, a semiconductor laser diode 5 is used as the measuring light source, the power is <1 mW, and the laser beam is shaped and driven by the collimating optical lens 4 to form a pulsed modulation point light source with a diameter of 0.25 to 0.45 mm—— Measuring beam 6; a level sensor cavity 8 is injection-molded with black plastic, its inner cavity is a sphere with a diameter of 30mm, and its shape is a cylinder with a height of 50mm and a diameter of 40mm, and a liquid injection hole with a diameter of 1mm is designed on one side of the cylinder 12. A laser diode 5 and an optical lens 4 are installed on the bottom of the cylinder, and a spot displacement measuring device 1 is installed on the top of the cylinder. The displacement measuring device selected in this embodiment is a two-dimensional PSD position-sensitive sensor, and a four-operation anti-corrosion sensor is installed above it. Add a piece of protective gla...

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Abstract

The invention relates to levelness measuring method and device. It uses laser as detecting collimated light source, offset caused by different refractive index medium interface facula for light beam to realize two-dimension levelness high precision measure. It is based on classic light reflection principle, uses two-dimension PSD position-sensitive sensor as mark target to increase measuring precision. The adopted medium is high refractive index liquid and low refractive index gas which can increase light beam refraction angle to improve level sensor resolution. The output type is analog quantity or digital signal which is easy to match with meter or computer equipment. The device has the advantages of simple structure, reliable measuring data, exact calculating result which can realize two-dimension levelness quantitative detection.

Description

technical field [0001] The invention relates to a method and a measuring device for measuring the levelness, in particular to a laser as a detection collimated light source, which realizes the two-dimensional levelness measurement by measuring the offset generated by the beam passing through the interface of different refractive index media. A method and device for high-precision measurement. Background technique [0002] In daily scientific research, production, and life, the measurement of plane levelness has extensive practical significance. As ships, ships, tanks, artillery and industrial robots have higher requirements for working attitude control accuracy, as well as offshore oil production platforms, bridges, high-rise buildings, satellite communication parabolic antennas, and observatory telescopes, the requirements for azimuth accuracy have become more and more stringent. The accurate measurement of levelness is even more important. [00...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01C9/18G01C5/00G01C15/00
Inventor 周望
Owner SUZHOU UNIV
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