Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Low temperature fast curing adhesive for mounting chip element and device

A rapid curing and component technology, applied in the direction of adhesives, epoxy glue, adhesive types, etc., can solve problems such as component damage

Inactive Publication Date: 2007-06-06
三友(天津)高分子技术有限公司
View PDF0 Cites 22 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the existing surface mount adhesives for chip components generally need to be cured at 150°C, which will cause damage to some components. For example, the curing time of a chip in a chemical institute is 5 minutes at 150°C, and The temperature is 12 minutes, the storage period is 3 months under 5 ℃

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0014] E56 epoxy resin: 32%

[0015] E51 epoxy resin: 22%

[0016] Propylene oxide butyl ether: 5%

[0017] Dibutyl phthalate: 7%

[0018] Fatty Amine Phenol Complex: 22%

[0019] Alkyl imidazolium salt: 4%

[0020] Fumed silica: 6%

[0021] Inorganic red or yellow pigments: 2%

Embodiment 2

[0023] Hydrogenated bisphenol A epoxy resin: 45%

[0024] 4-tert-butylphenyl glycidyl ether: 5.5%

[0025] Dibutyl phthalate: 7.5%

[0026] Modified fatty amine adduct: 28%

[0027] Fumed silica: 5%

[0028] Aluminum oxide powder: 6%

[0029] Inorganic red pigment: 3%

Embodiment 3

[0031] Bisphenol F epoxy resin: 55%

[0032] Dibutyl phthalate: 8%

[0033] Isophthalic acid dihydrazide: 10%

[0034] 23# substituted urea: 8%

[0035] Fumed silica: 7%

[0036] Silica powder: 6%

[0037] Aluminum oxide powder: 5%

[0038] Oil-soluble red pigment: 1%

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
Viscosityaaaaaaaaaa
Curing timeaaaaaaaaaa
Adhesive strengthaaaaaaaaaa
Login to View More

Abstract

The low temperature fast curing adhesive for mounting chip element and device is compounded with liquid epoxy resin 30-60 wt%, diluent 5-15 wt%, curing agent 8-20 wt%, promoter 2-10 wt%, thixotropic agent 4-12 wt%, plasticizer 5-10 wt%, pigment 1-3 wt% and inorganic filler 0-20 wt%. It has curing period of 80 sec at 120 deg.c and 180 sec at 100 deg.c, adhesion strength of 10-20 MPa, absolute resistivity high than 1013 Ohm. cm, water absorption less than 0.5 %, storage life over 2 months at 20 deg.c, and zero rolling. It is used in the surface mounting of electronic elements and device.

Description

technical field [0001] The invention relates to an adhesive material, in particular to a low-temperature fast-curing adhesive for mounting chip components used in the surface mounting technology of chip components in the electronic industry. technical background [0002] With the rapid development of the electronics industry, the performance requirements for surface mount technology (SMT) adhesives are getting higher and higher. Not only do electronic components require high surface mount strength, high temperature resistance, and good electrical insulation in automated assembly line production, It is suitable for SMT automatic placement machine placement or stencil printing placement, and requires low curing temperature and short time. However, the existing surface mount adhesives for chip components generally need to be cured at 150°C, which will cause damage to some components. For example, the curing time of a chip in a chemical institute is 5 minutes at 150°C, and The ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): C09J163/00
Inventor 李士学高之香
Owner 三友(天津)高分子技术有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products