Tantalum doping tin oxide thin film carrier material for gene chip
A carrier material, gene chip technology, applied in the direction of analyzing materials, material analysis by electromagnetic means, biochemical equipment and methods, etc., can solve the problem of poor stability of biological signal detection sensitivity chips, expensive biological signal detection equipment, and has not yet been found. Tantalum-doped tin oxide thin film and other problems, to achieve high sensitivity and strong specificity label-free electrical detection, easy industrial production, simple and easy preparation process
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Embodiment 1
[0034] (1) Ta with a purity of 99.99% 2 o 5 and SnO 2 The powder is fully mixed, pressed into a billet under a pressure of 80Mpa, put into a high-temperature sintering furnace and sintered at 1650°C for 3 hours to obtain a tantalum-doped tin oxide sputtering target, in which Ta 2 o5 The mass percentage (wt.%) is 1%, SnO 2 The mass percentage (wt.%) of the target is 99%, and the size of the target is 60mm in diameter and 6mm in thickness;
[0035] (2) The prepared tantalum-doped tin oxide sputtering target is fully cleaned with analytical pure acetone and deionized water, then placed in an oven, and kept at 120°C for 3 hours to remove surface oil and other impurities;
[0036] (3) Use ordinary slide glass as the film substrate material, fully wash it with analytical pure acetone and deionized water before sputtering, then put it in an oven, and keep it warm at 80°C for 2 hours;
[0037] (4) Install and put the target material and glass slide pretreated in (2) and (3) into t...
Embodiment 2
[0043] Except that the composition and preparation parameters of the sputtering target are different from those in Example 1: the Ta with a purity of 99.99% 2 o 5 and SnO 2 The powder is fully mixed, pressed into a billet under a pressure of 80Mpa, put into a high-temperature sintering furnace and sintered at 1600°C for 4 hours to obtain a tantalum-doped tin oxide sputtering target, in which Ta 2 o 5 The mass percentage (wt.%) is 5%, SnO 2 The mass percentage (wt.%) of the target material is 95%, the size of the target is 60mm in diameter and 6mm in thickness, and the composition of the prepared film is the following mass percentage (wt.%): Ta 4.1%, Sn 74.8% , O 21.1%, the thickness of the film is 120nm, and the resistivity is 2.1×10 -3 Ω·cm.
[0044] All the other processing steps are identical with embodiment 1.
Embodiment 3
[0046] (1) Ta with a purity of 99.99% 2 o 5 and SnO 2 The powder is fully mixed, pressed into a billet under a pressure of 80Mpa, put into a high-temperature sintering furnace and sintered at 1600°C for 4 hours to obtain a tantalum-doped tin oxide sputtering target, in which Ta 2 o 5 The mass percentage (wt.%) is 5%, SnO 2 The mass percentage (wt.%) of the target is 95%, and the size of the target is 60mm in diameter and 6mm in thickness;
[0047] (2) The prepared tantalum-doped tin oxide sputtering target is fully cleaned with analytical pure acetone and deionized water, then placed in an oven, and kept at 140°C for 2 hours to remove surface oil and other impurities;
[0048] (3) Use ordinary glass slides as the film substrate material, fully wash them with analytical pure acetone and deionized water before sputtering, then put them in an oven, and keep them warm at 90°C for 1 hour;
[0049] (4) Install and put the pretreated target material and single crystal silicon (1...
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