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Power VDMOS cut-in voltage remote on-line automatic test system and method

An automatic test system, open voltage technology, applied in the direction of general control system, control/regulation system, single semiconductor device test, etc., can solve the problems of large human reading error, deviation of test accuracy, and inability to realize computer-controlled computer accurate reading, etc. Achieve the effects of improving defects, saving test costs, and reducing ionizing radiation damage

Inactive Publication Date: 2009-06-17
INST OF MICROELECTRONICS CHINESE ACAD OF SCI
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Problems solved by technology

[0005] At present, the measurement of power VDMOS generally adopts transistor testers such as QT2. These devices adopt the backward technology of screen reading, and the functions of computer control and computer accurate reading cannot be realized at present.
This leads to relatively large deviations in test accuracy and relatively large errors in human readings

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  • Power VDMOS cut-in voltage remote on-line automatic test system and method
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  • Power VDMOS cut-in voltage remote on-line automatic test system and method

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Embodiment Construction

[0055] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in further detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0056] Such as figure 1 as shown, figure 1 It is a structural block diagram of a remote on-line automatic test system for power VDMOS turn-on voltage provided by the present invention. The system includes a control computer, a data acquisition card, a test development board and a DUT plug-in development board in an irradiation source.

[0057] Wherein, the control computer is used for running the graphic monitoring test program, outputting the control signal to the data acquisition card, receiving and displaying the opening voltage test result returned by the data acquisition card. The data acquisition card is used to output the clock signal to the test development board according to the control signal received from the ...

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Abstract

The invention discloses a power VDMOS threshold voltage remote online automatic test system, which comprises a control computer, a data acquisition card, a test development board and a DUT plug-in development board in an irradiation source. The invention also discloses a VDMOS threshold voltage remote online automatic test method. The adoption of the method realizes VDMOS threshold voltage remote online accurate measurement in the irradiation environment which the experimenters can not enter, including total dose irradiation, dose rate irradiation, single particle and neutron irradiation, in addition, real-time display of a testing curve on the computer screen is realized and real-time display and processing of test results and the threshold voltage are realized.

Description

technical field [0001] The invention relates to the technical field of semiconductor experiment testing, in particular to a remote online automatic testing system and method for power VDMOS turn-on voltage. Background technique [0002] The power VDMOS transistor (Vertical Double-diffusion MOSFET) has the advantages of both bipolar power transistors and MOS devices, and has the characteristics of fast switching speed, high input resistance, low driving power consumption, good frequency characteristics, high driving capability, and highly linear transconductance. , and has a negative temperature coefficient, no secondary breakdown of bipolar power tubes, and a large safe operating area. It is an ideal power device, so it is widely used in electronic components and circuits of space systems. [0003] However, under the irradiation of space charged particles and rays, its performance will be affected by the cumulative dose of radiation, and even its function will fail. Compare...

Claims

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Application Information

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IPC IPC(8): G01R31/26G05B19/048G06F9/44
Inventor 蔡小五赵发展海潮和陆江王立新
Owner INST OF MICROELECTRONICS CHINESE ACAD OF SCI
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