Method for screen printing of fine mask on surface of silicon slice based on vacuum freeze drying technology
A silicon wafer surface, vacuum freeze-drying technology, used in sustainable manufacturing/processing, climate sustainability, semiconductor devices, etc., can solve the problems of high process conditions, low requirements, difficult line width control, etc., to reduce cost effect
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0023] Embodiment 1. Use the method of the present invention to screen-print a fine mask on the surface of a solar silicon wafer, and the line width of the mask is between 70 um and 100 um.
[0024] First, liquid materials are prepared. The viscosity of the liquid material is 500-1000cps, and the ingredients are high molecular polymer powder and solvent. The mass percentage of high molecular polymer powder and solvent is:
[0025] High molecular polymer powder 80%~70%
[0026] Solvent 30%~20%;
[0027] The polymer powder can be selected from one or more combinations of epoxy resin, polyurethane acrylate, polyester acrylate, polyether acrylate and epoxy acrylate; The bulk particle diameter should be less than 20um to the minimum fineness that the existing technology can achieve;
[0028] The solvent can be selected from acetone, ethylene glycol, butylene glycol, neopentyl glycol, ethylene glycol, diethylene glycol, triethylene glycol, polyethylene glycol or diacrylate.
[0...
Embodiment 2
[0035] Embodiment 2 is basically the same as Embodiment 1, except that the thickness of the mask formed on the surface of the silicon wafer is 100um; the viscosity of the photosensitive liquid material is 1000cps.
Embodiment 3
[0036] Embodiment 3 is basically the same as Embodiment 1, except that the thickness of the mask formed on the surface of the silicon wafer is 50um; the viscosity of the photosensitive liquid material is 800cps.
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More 