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Method for making nano-sized phase change memory

A phase-change memory and nanometer-sized technology, which is applied in the field of microelectronics, can solve problems such as high cost, and achieve the effects of convenient preparation, cost reduction, and simple device structure

Inactive Publication Date: 2012-04-25
INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] At present, the methods of obtaining small size mainly include electron beam lithography (EBL), focused ion beam lithography (FIB), etc., but their cost is too high

Method used

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  • Method for making nano-sized phase change memory
  • Method for making nano-sized phase change memory
  • Method for making nano-sized phase change memory

Examples

Experimental program
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Effect test

Embodiment 1

[0059] 1. Using semiconductor or insulating materials such as monocrystalline silicon wafers and SOI wafers as the substrate 101;

[0060] 2. Using a thin film preparation process, an electric thermal insulation layer silicon nitride 102 is prepared on the substrate;

[0061] 3. Depositing polysilicon on the electrical and thermal insulating layer silicon nitride by LPCVD as the sidewall substrate 103 for making the metal GAP, and then forming the sidewall substrate pattern by optical lithography and dry etching. as shown in picture 2.

[0062] 4. Deposit silicon dioxide 104 as a sacrificial sidewall material by PECVD, as shown in FIG. 3 ; then dry etching back to form a sacrificial sidewall. As shown in Figure 4.

[0063] 5. Rinse off the sidewall substrate with potassium hydroxide solution (potassium hydroxide solution has a relatively high etching selection for substrate silicon nitride and sidewall silicon dioxide), as shown in FIG. 5 .

[0064] 6. Form a tungsten metal...

Embodiment 2

[0069] The specific steps and conditions are the same as those in Example 1, except that silicon dioxide is used as the sidewall substrate of the metal NANOGAP, and polysilicon is used as the sacrificial sidewall.

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Abstract

The invention discloses a method for making a nano-sized phase change memory, comprising the steps of: firstly depositing a layer of electrothermal insulating material with strong corrosion resistant performance on a silicon substrate; then preparing a piece of nano-sized metal GAP on the surface of the material by a sidewall process; then preparing a nano-sized phase change material by the sidewall process again; filling the nano phase change material into the metal GAP; passivating and opening a hole for introducing out electrodes; and finally preparing a nano-sized phase change storage device. The invention avoids the defects of high cost and long period due to exposure by using electronic beams; the nano-sized phase change memory is prepared only by adopting a lithography process and two steps of sidewall processes; and the method has a great superiority in the aspects of breaking through lithography resolution limit, enhancing device preparation efficiency and the like.

Description

technical field [0001] The invention relates to the technical field of microelectronics, in particular to a method for manufacturing a nanoscale phase-change memory. The invention proposes a method for preparing the metal NANOGAP and the nano-strips of the phase-change material for filling the phase-change material by adopting two-step sidewall technology, so as to manufacture the nanometer-sized phase-change memory. This method avoids the disadvantages of high cost and long cycle of electron beam exposure, and has great advantages in breaking through the limitation of photolithography resolution and improving the efficiency of device preparation. Background technique [0002] With the rapid development of the information industry, people's requirements for mobile storage are increasing rapidly. Due to the relatively slow writing speed and high operating voltage of flash memory (Flash) storage technology, it is difficult to achieve nanoscale small size to improve integratio...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L45/00H01L21/84H01L27/24
Inventor 田晓丽王晓峰张加勇杨富华王晓东
Owner INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI