Program control X-ray diffractometer

A technology of X-ray and diffractometer, which is applied in the instrument field of material microstructure analysis, to achieve the effect of conveniently judging fault information, ensuring accuracy, and flexibly adapting

Active Publication Date: 2010-09-15
丹东通达科技有限公司
View PDF3 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Aiming at the problems existing in the existing X-ray diffractometer, the present invention proposes an X-ray diffractometer device with simple structure, high control sensitivity, low failure rate, convenient maintenance and high measurement accuracy

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Program control X-ray diffractometer
  • Program control X-ray diffractometer
  • Program control X-ray diffractometer

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0023] The structure of the present invention is illustrated in conjunction with the accompanying drawings.

[0024] A program-controlled X-ray diffractometer, such as figure 1 , figure 2 As shown, a conventional X-ray generating device 2 and a goniometer 3 are installed in the housing 1, the drive shaft of the goniometer 3 is connected to the drive shaft of the servo motor 4, and the signal output and input ends of the servo motor 4 are connected to the T motor socket on the program control device 59; the structure of the program-controlled device 5 is: as image 3 As shown, a touch screen 52, an emergency stop switch 53, and three kinds of indicator lights 54 are installed on the front panel of the program-controlled device housing 51; Figure 4 As shown, F1, F2, F3 fuse holder 55, limit socket 56, shutter control socket 57, lead door socket 58, T motor control socket 59, filter power socket 510, ground terminal 511, water pump control socket 512, AI / AO socket 513 , pow...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to a program control X-ray diffractometer which is structurally characterized in that a conventional X-ray generating device and a goniometer are arranged in a shell; the drive shaft of the goniometer is connected with the transmission shaft of a servo motor; the signal output / input end of the servo motor is connected with a program control device; and an amplification board, a high-voltage board, a power board, an isolating board and an S7-200 PLC (Programmable Logic Controller) are arranged in the shell of the program control device wherein the port PORTO of the PLC is connected with a computer. Since the PLC is installed and triplex non-interfering isolating protection is adopted, the performance of the diffractometer is more superior, the fault rate is extremely low, and the service life of the complete machine is prolonged. An integrated motor is adopted as the motor for controlling the goniometer; a high-resolution magnetic encoder can automatically correct a very small movement position error by a high-precision full-closed loop vector drive servo system to ensure the degree of accuracy of the measuring result of the diffractometer. A recording unit realizes man-machine interaction, has complete protection function, and convenient and visualized operation and brings convenience for operators to use and judge fault information and the like. The diffractometer is suitable for the test, analysis and research work of the microscopic structure of matter.

Description

technical field [0001] The invention relates to an instrument for material microstructure analysis, in particular to an X-ray diffractometer device. Background technique [0002] X-ray diffractometer is an essential instrument for testing, analyzing and studying the microstructure of matter. The X-ray diffractometer is composed of an X-ray generating device, a goniometer, a data computing device and a control device. Since the control device is a control system composed of a single-chip microcomputer and 15 circuit boards, its high-voltage control unit is not electrically isolated from the management system. board, circuit control is complicated, it is not easy to debug and install, and the service life of the whole machine is reduced. The goniometer is the core device of the diffractometer. The stepper motor installed on the goniometer has no automatic error correction function, which affects the control accuracy of the goniometer. The text display of the recording unit c...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/20G05B19/05
Inventor 张国浩
Owner 丹东通达科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap