Thermal radiation infrared transmitting and probing integrated device
An infrared emission and integrated device technology, which is used in the measurement of fluid velocity using thermal variables, the application of thermal effects to detect fluid flow, instruments, etc., to achieve the effects of simple manufacturing process, reduction of thermal stress, and simple structure
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[0018] The basic optical multilayer structure of the narrow-band thermal infrared emission and infrared absorption integrated device of the present invention adopts the MDM structure, where M represents a conductive layer such as a metal or non-metal conductive compound, and D represents an insulating or semiconductor dielectric layer, which can be one or more Combination layers of dielectric materials. The basic principle is that when thermally excited radiation or external incident radiation coupling in the structure excites the SPP mode in the MDM, the SPP mode will be confined in the dielectric layer D to enhance emission or absorption. The SPP mode in the MDM structure can be divided into three types, corresponding to figure 1 The curves of Ⅰ, Ⅱ and Ⅲ in the MDM dispersion relation shown, figure 1 Ω in p And k p Are the plasma frequency and wave vector in M, ω SP Is the frequency of the excited SPP mode. It is noteworthy that figure 1 The patterns represented by the type...
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