Method for preparing CMP (Chemically Mechanical Polishing) solution for sapphire substrate material

A technology of sapphire substrate and polishing liquid, which is applied in the direction of polishing composition containing abrasives, etc., can solve the problems of metal ions, harmful pollution of large particles, reduced device yield, and increased cost, and achieve high speed, high smoothness and low damage Effects of polishing, cost reduction, and less pollution

Inactive Publication Date: 2011-04-13
TIANJIN JINGLING MICROELECTRONIC MATERIALS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

At present, most of the polishing liquid used in the mass production of sapphire in China is imported. One of the reasons is the negative effects such as pollution caused by the traditional domestic polishing liquid preparation method.
Such as traditional compounding and mechanical stirring and other preparation methods are likely to cause harmful pollution such as organic matter, metal ions, large particles, etc., resulting in an increase in the cost of subsequent processing and a decrease in device yield

Method used

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  • Method for preparing CMP (Chemically Mechanical Polishing) solution for sapphire substrate material

Examples

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Effect test

Embodiment 1

[0029] Embodiment 1: preparation 4000g sapphire substrate polishing liquid

[0030] Under negative pressure stirring, take 160g triethanolamine, weigh 40gKOH, dilute with 200g18MΩ or more ultra-pure deionized water, inhale 40gFA / O active agent and 40gFA / O chelating agent in sequence, and then inhale the particle size under negative pressure. 15-25nm nano-SiO 2 800g of sol was inhaled, and finally 2720g of deionized water was inhaled while stirring. After stirring evenly under the vortex state, 4000g of sapphire substrate polishing liquid is obtained, which can be filled after stirring evenly.

Embodiment 2

[0031] Embodiment 2: preparation 4000g sapphire substrate polishing liquid

[0032] Under negative pressure stirring, take 80g of tetramethylammonium hydroxide, weigh 20gKOH and dilute with 100g of ultra-pure deionized water above 18MΩ, 10g of FA / O active agent and 10g of FA / O chelating agent into the closed reactor in order, and then inhale them under negative pressure. Nano-SiO with a particle size of 15-25nm 2 3600g of sol was inhaled, and finally 180g of deionized water was inhaled while stirring. After stirring evenly under the vortex state, 4000g of sapphire substrate polishing liquid is obtained, which can be filled after stirring evenly.

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Abstract

The invention relates to a method for preparing a CMP (Chemically Mechanical Polishing) solution in a high-precision surface finishing process of a sapphire substrate material. In the method, a nano SiO2 abrasive material is adopted for the polishing solution, wherein the abrasive material has the concentration of 30-50wt% and the particle diameter of 15-100nm so as to benefit material removal and surface leveling. The pH value of the polishing solution is 9-13, which not only benefits effective removal but also guarantees the stability of silica sol; and in a preparation process, a negative pressure stirring preparation method is adopted under a closed system, and pollutions of organic matters, large particles, metal ions and the like brought by the traditional preparation methods of compounding, mechanical stirring and the like are prevented so that the requirement on ultra cleanness is met.

Description

technical field [0001] The invention belongs to a method for preparing a polishing liquid, in particular to a method for preparing a polishing liquid for a sapphire substrate material. Background technique [0002] Sapphire single crystal (Sapphire), also known as white gem, the molecular formula is Al 2 o 3 , transparent, has the same optical and mechanical properties as natural gemstones, has good thermal properties, excellent electrical and dielectric properties, and chemical corrosion resistance, high infrared transmittance, and good wear resistance The hardness is second only to diamond, with a Ta Mok's grade of 9, and it still has good stability at high temperatures, with a melting point of 2030°C, so it is widely used in industry, national defense, scientific research and other fields, and is increasingly used as Manufacturing materials for parts in high-tech fields such as solid-state lasers, infrared windows, substrates for semiconductor chips, and precision wear-...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): C09G1/02
Inventor 刘玉岭牛新环刘金玉
Owner TIANJIN JINGLING MICROELECTRONIC MATERIALS CO LTD
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