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Power type GaN base Schottky diode and manufacture method thereof

A Schottky diode, power type technology, applied in semiconductor/solid-state device manufacturing, electrical components, circuits, etc., can solve the problems of small size and high cost of GaN self-supporting substrates, improve heat dissipation characteristics, and reduce heat dissipation design requirements , the effect of good thermal conductivity

Active Publication Date: 2011-05-11
SUN YAT SEN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the GaN self-supporting substrate of the conductive structure device with upper and lower electrodes has high cost and small size, and other heterogeneous epitaxial substrates are more economical and convenient for large-scale industrial production.

Method used

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  • Power type GaN base Schottky diode and manufacture method thereof
  • Power type GaN base Schottky diode and manufacture method thereof
  • Power type GaN base Schottky diode and manufacture method thereof

Examples

Experimental program
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Embodiment 1

[0045] Such as figure 1 As shown, this embodiment shows the structure of a GaN-based Schottky diode with an upper and lower electrode structure in the present invention, which includes: a metal substrate 11 and a semiconductor epitaxial stack connected through the metal substrate 11, the semiconductor epitaxial stack The layer consists of an outward-facing metal substrate 11, which in turn includes an N-type GaN layer 3, a low-doped GaN layer 4, and a Schottky metal layer 10; the GaN-based Schottky diode has an upper and lower electrode structure, and the metal substrate 11 and Schottky The base metal layer 10 together serves as the anode of the Schottky diode; a metal electrode is provided under the N-type GaN layer 3 as the cathode. A buffer layer 2 is provided between the N-type GaN layer 3 and the metal electrode, and the metal electrode passes through the buffer layer 2 as a cathode.

[0046] A cylindrical hole 5 and a small cylindrical hole 6 are provided in the low-doped ...

Embodiment 2

[0049] Such as figure 2 Shown is a schematic diagram of the second structure of a GaN-based Schottky diode with a conductive structure of upper and lower electrodes of the present invention. The structure in this embodiment is basically the same as that in Embodiment 1, except that when the substrate is wet etched After Si, a metal layer 12 is deposited on the lower surface of the buffer layer 2 through an evaporation process, which forms a good ohmic contact with the conductive material 7, and together serves as the cathode of the Schottky diode, which is conducive to current conduction , And parallel packaging of devices.

Embodiment 3

[0051] Such as image 3 As shown, it is a schematic diagram of the third structure of a GaN-based Schottky diode with a conductive structure of upper and lower electrodes of the present invention. The structure in this embodiment is basically the same as that in Embodiment 1. The semiconductor epitaxial stack is sequentially comprised of the outer metal substrate 11 N-type GaN layer 3, low-doped GaN layer 4, and Schottky metal layer 10. The difference is that when the substrate Si1 is wet-etched, the stress buffer layer 2 is etched away by dry etching technology, and then a metal layer 12 is plated on the bottom surface through an evaporation process, and the N-type GaN Layer 3 forms a good ohmic contact and together serves as the cathode of the Schottky diode. This structure has a simple process, no through-hole structure is needed, and the process is simplified.

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Abstract

The invention discloses a power type GaN base Schottky diode in an upper electrode and lower electrode structure and a manufacture method thereof. The substrate of an epitaxial layer of a semiconductor is transferred by an Si substrate lift-off technology as follows: an epitaxial film is transferred to a metallic substrate with good electric-conducting and heat-conducting properties, and then the Si substrate is lifted off, thereby improving the heat dispersion of a device and reducing the on resistance of the device; and transmission of current between the upper electrode and the lower electrode in the device is realized by the technical means of directly coating ohmic contact on the N type GaN layer by evaporation, or etching a through hole in the epitaxial layer of the semiconductor, and coating ohmic contact in the through hole by evaporation. The invention improves the heat dispersion of the power type GaN base Schottky diode, reduces the on resistance of the device, can acquire large current easily, is suitable for the GaN epitaxial material of the Si substrate, has large wafer size and low cost, and is favorable for large-scale industrial production.

Description

Technical field [0001] The invention relates to a Schottky diode and a preparation method thereof, in particular to a power type GaN-based Schottky diode with an upper and lower electrode structure and a preparation method thereof. Background technique [0002] The Schottky diode is a majority carrier device that uses the rectification characteristics of the metal and semiconductor contacts to work. Compared with diodes such as PN junction and p-i-n, it has the characteristics of low turn-on voltage, low reverse recovery current, fast switching speed, and low power consumption. So far, Si-based devices have approached the theoretical limit. To achieve high efficiency, heat resistance, voltage resistance and high power characteristics, a new generation of wide-bandgap semiconductor materials are needed to support it. [0003] GaN is a wide-bandgap semiconductor material. It has excellent physical and chemical properties, such as large forbidden band width, high breakdown electric ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L29/812H01L21/38H01L29/41H01L29/43
Inventor 刘扬贺致远李佳林张佰君
Owner SUN YAT SEN UNIV