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Manufacturing method for ohmic contact with low specific contact resistance and low roughness

A technology of ohmic contact and manufacturing method, applied in the field of low-roughness ohmic contact manufacturing and low-specific contact resistance, can solve the problems of poor Mo thickness and evaporation conditions, and metal warping and peeling off, so as to improve the overlay accuracy and improve the Stable, easy to achieve results

Active Publication Date: 2011-11-02
THE 13TH RES INST OF CHINA ELECTRONICS TECH GRP CORP
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] There are some reports about the TiAlMoAu system in foreign countries. The report also mentions the good effect of Mo on improving the surface morphology, but the problem of Mo adhesion is ignored. However, we have found through experiments that the thickness of Mo and the evaporation The conditions are not well controlled, and the Mo / Au two-layer metal skin is often warped or even peeled off.

Method used

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  • Manufacturing method for ohmic contact with low specific contact resistance and low roughness
  • Manufacturing method for ohmic contact with low specific contact resistance and low roughness
  • Manufacturing method for ohmic contact with low specific contact resistance and low roughness

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Embodiment Construction

[0021] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0022] A manufacturing method of low specific contact resistance and low roughness ohmic contact, characterized in that said manufacturing method comprises the following steps:

[0023] A. Evaporation to form ohmic contact: Put the clean metal source (including metal Ti, Al, Ni, Mo and Au) into the crucible of the electron beam evaporation table, and then perform the melting source process to make the metal meet the evaporation needs. Afterwards, place the GaN epitaxial material wafer with photolithographic ohmic contact pattern on the planet carrier of the electron beam evaporation table, and wait for the vacuum degree in the chamber of the electron beam evaporation table to reach 7×10 -7 Torr, according to the order of Ti, Al, Ni, Mo, Au, the metal evaporation process is performed sequentially to form an ohmic contact;

[0024] B. ...

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Abstract

The invention discloses a manufacturing method for ohmic contact with low specific contact resistance and low roughness. The manufacturing method is characterized in that hardly compatible Mo metal is introduced to an ohmic contact metal seed to form a TiAlNiMoAu combination, thus the surface roughness and the specific contact resistance after alloying are reduced under the same alloying condition. In the manufacturing method, the low diffusivity of the Mo is utilized, and a binary alloy phase is matched, thus low contact resistance is realized, the roughness of the ohmic contact after alloying is also reduced, the overlay accuracy of a photolithographic process is improved, the number of process steps is reduced, the stability of the ohmic contact is improved, and a firm foundation is established for device process practicability.

Description

technical field [0001] The invention relates to a method for designing and manufacturing semiconductor microelectronics, in particular to a method for manufacturing an ohmic contact with low specific contact resistance and low roughness. Background technique [0002] The formation of ohmic contacts on n-type or unintentionally doped GaN and AlGaN materials is a complex process involving a variety of solid-state reactions. Using the relevant knowledge of physics, metallurgy and chemistry, the design includes multilayer The metallization system of metal may produce alloying or solid phase regrowth after heating the metallization system, thus forming an ohmic contact of "metal-GaN layer (AlGaN layer)-semiconductor". [0003] The formation of alloy ohmic contacts on GaN or AlGaN needs to meet some basic design requirements. The first is the barrier layer. The principle of selecting a metal for this layer is to form a low-resistance, low work function, thin and thermally stable ...

Claims

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Application Information

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IPC IPC(8): H01L21/28H01L21/285C23C14/18C23C14/30
Inventor 宋建博张志国于峰涛王勇
Owner THE 13TH RES INST OF CHINA ELECTRONICS TECH GRP CORP
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