Supercharge Your Innovation With Domain-Expert AI Agents!

Semiconductor component packaging structure and manufacturing method thereof

A technology of packaging structure and manufacturing method, applied in semiconductor/solid-state device manufacturing, semiconductor devices, semiconductor/solid-state device components, etc., can solve the problems of increased cost, difficulty in controlling the surface of crystal grains at the same level, etc. effect of grain displacement, improved mechanical reliability, and increased packaging productivity

Inactive Publication Date: 2012-03-14
KING DRAGON INT
View PDF7 Cites 15 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Since the encapsulation compound or epoxy will warp after thermal curing, it is difficult to control the surface of the die and the above compound at the same level, so a chemical mechanical polishing process is required to polish the uneven surface, so the cost is also high. and improve

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Semiconductor component packaging structure and manufacturing method thereof
  • Semiconductor component packaging structure and manufacturing method thereof
  • Semiconductor component packaging structure and manufacturing method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0072] The present invention will be described with preferred embodiments and accompanying drawings. It must be understood, however, that these referenced embodiments of the invention are for illustration purposes only. In addition to the preferred embodiments mentioned here, the present invention can be widely practiced in other embodiments.

[0073] The present invention discloses a crystal grain or multi-chip embedded substrate structure; the substrate has dual built up layers covering two surfaces. Figure 12To illustrate a cross-sectional view of a system in package (system in package) structure, the above-mentioned substrate has a die-embedded structure, double side build uplayers, passive components, wafer level chip size package structure (wafer level chip scale package, WL-CSP), chip scale package structure (chip scale package, CSP), ball grid array (ball gridarray, BGA) and flip-chip (flip-chip), etc. According to the teachings of the present invention, the surface...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present invention relates to a semiconductor component packaging structure and a manufacturing method thereof. The semiconductor component packaging structure comprises a first substrate which is provided with a grain metal pad, a first conducting wire circuit and a second conducting wire circuit; grains which are arranged on the upper surface of the grain metal pad; a second substrate which is provided with a grain accommodating opening for accommodating the grains, a third conducting wire circuit and a forth conducting wire circuit, wherein the depth of the grains is equal to that of the second substrate; glue layers which are arranged on the upper surface of the first substrate and bottom surfaces of the second substrate and the grains; and first dielectric layers which are arranged on upper surfaces of the grains and the second substrate, and between sides walls of the grains and side walls of the grain accommodating openings, and each first dielectric layer comprises a plurality of hole areas. The semiconductor component packaging structure has excellent thermal expansion coefficient matching performance and downsizing size, the substrate is provided with the grain accommodating opening, thus the mechanical reliability can be improved and the size of components can be reduced.

Description

technical field [0001] The invention relates to a crystal grain embedded substrate structure formed into a panel form package, in particular to a semiconductor element package structure and a manufacturing method thereof. Background technique [0002] Overcast casting, commonly known as lost wax casting, is a casting process that enables metal or metal alloys to be fabricated into near-net-shape metal parts. Overcasting is commonly used in the process of forming intricate and complex shapes with high precision. Refractory crucibles are used in the overmold casting process to melt metal alloys. In this view, the alloy is melted in a crucible and then poured from the crucible into a mold to form a cast. Conventional refractory crucibles, such as zirconia crucibles, usually have a porous structure in part to increase resistance to thermal shock and further minimize the possibility of cracking. [0003] In the field of semiconductor components, as the size of components conti...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H01L23/538H01L23/00H01L23/498H01L21/603H01L21/56
CPCH01L24/97H01L2224/12105H01L2224/16225H01L2224/24H01L2224/24155H01L2224/32225H01L2224/73267H01L2224/92244H01L2924/14H01L2924/15311H01L2924/181H01L2924/19105H01L2924/351
Inventor 杨文焜
Owner KING DRAGON INT
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More