A kind of preparation method of ni-cr magnetron sputtering target material
A magnetron sputtering and ni-cr technology, which is applied in the field of Ni-Cr magnetron sputtering target preparation, can solve the problems of poor density, poor grain size and distribution uniformity, and coarse grains, etc. Excellent density, uniform size distribution, and high purity
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Embodiment 1
[0025] The preparation method of Ni-Cr magnetron sputtering target material, its method step is as follows:
[0026] 1. Raw material preparation: take electrolytic nickel with a purity of 99.96%, metal chromium with a purity of 99.09%, and 0.52kg of rare earth;
[0027] 2. Vacuum smelting: remove dirt and oxides on the surface of nickel and chromium plates and weigh them dry. According to the weight ratio of Ni and Cr of 4:1, 103.76kg of electrolytic nickel and 26.24kg of metal chromium are weighed, and the melting temperature is 1450- 1550°C, smelting time is 60min, the ambient vacuum is lower than 8Pa during the smelting process, and 0.4wt.% rare earth elements are added under vacuum and argon protective atmosphere before the furnace is released;
[0028] 3. Pouring: Pouring under vacuum and argon protective atmosphere, demoulding 40 minutes after pouring, cutting off the riser, removing the surface oxide skin, the processed ingot is a round platform, the diameter of the sma...
Embodiment 2
[0034] The preparation method steps of the Ni-Cr magnetron sputtering target are the same as in Example 1, wherein the addition of rare earth elements in step 2 is changed to 0.2wt.%, and the obtained Ni-Cr target grain size is less than 30 μm, and the size distribution Uniform, the metallographic picture is attached figure 2 .
Embodiment 3
[0036] The steps of the preparation method of the Ni-Cr magnetron sputtering target are the same as in Example 1, wherein the addition of rare earth elements in step 2 is changed to 0.05wt.%, and the grain size of the obtained Ni-Cr target is less than 25 μm, and the size distribution Uniform, the metallographic picture is attached image 3 .
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