A fe-si-al system ternary amorphous thin film with adjustable bandgap width and preparation method thereof

An amorphous film and width technology, which is applied in the field of Fe-Si-Al ternary amorphous film and its preparation, can solve the problems of large film base mismatch, multi-phase mixing deterioration, stacking fault, twinning and other problems. Achieve the effect of avoiding lattice mismatch, avoiding multiphase mixing, and ensuring composition and performance

Inactive Publication Date: 2014-10-22
DALIAN UNIV OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The crystals are also prone to defects such as stacking faults and twins, so it is difficult to obtain high-quality and pure β-FeSi 2 Material
[0004] (2) β-FeSi 2 When used in the field of optoelectronics, most of the thin films are prepared on the basis of single crystal Si, but there is a large film-base mismatch problem, resulting in many of its properties failing to meet theoretical expectations.
[0005] (3) Binary β-FeSi currently prepared using different methods 2 material, whose bandgap width varies around 0.87eV, is slightly different, but cannot be modulated
Crystalline ternary FeSi after adding the third component 2 Type materials are prone to phase separation. Although the bandgap width can be modulated in a wide range, it increases the instability of the structure and further deteriorates the situation of multiphase mixing.

Method used

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  • A fe-si-al system ternary amorphous thin film with adjustable bandgap width and preparation method thereof
  • A fe-si-al system ternary amorphous thin film with adjustable bandgap width and preparation method thereof
  • A fe-si-al system ternary amorphous thin film with adjustable bandgap width and preparation method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0031] Example 1: Preparation of Fe by magnetron sputtering 37.6 Si 60.7 Al 1.7 film

[0032] (1) Preparation of alloy sputtering target, the steps are as follows:

[0033] 1. Preparation of materials: according to the atomic percentage of Fe and Al, it is respectively 4:0.15 to take by weighing each component value, and the purity of Fe and Al metal raw materials to be used: Fe is 99.99%, and Al is 99.999%;

[0034] ②Fe 4 Al 0.15 Smelting of alloy ingots: Put the metal mixture in the water-cooled copper crucible of the melting furnace, and use the vacuum arc melting method to smelt under the protection of argon gas. First, evacuate to 10 -2 Pa, and then filled with argon until the air pressure is 0.03±0.01MPa, and the control range of the melting current density is 150±10A / cm 2 , after melting, continue smelting for 10 seconds, cut off the power, let the alloy cool to room temperature with the copper crucible, then turn it over and place it in the water-cooled copper cr...

Embodiment 2

[0045] Example 2: Preparation of Fe by magnetron sputtering 33.6 Si 61.3 Al 5.1 film

[0046] The preparation process is the same as that of Example 1, only the Fe used to prepare the combined alloy sputtering target is adjusted. 4 Al z The number of alloy pieces and Z value: from 5.5 pieces of Fe 4 Al 0.5 Alloy flakes are made by pasting on the base Si target used for sputtering. The contents of Fe, Si, and Al in the EPMA films were 33.6 at.%, 61.3 at.%, and 5.1 at.%, respectively. The results of XRD and TEM showed that Fe 33.6 Si 61.3 Al 5.1 No crystal information was found in the sample, indicating that an amorphous film was prepared. The band gap width was measured to be 0.60 eV.

Embodiment 3

[0047] Example 3: Preparation of Fe by magnetron sputtering 25.8 Si 66.2 Al 8.0 film

[0048] The preparation process is the same as that of Example 1, only the Fe used to prepare the combined alloy sputtering target is adjusted. 4 Al z Number of alloy pieces and Z value: from 4 pieces of Fe 4 Al 1 Alloy flakes are made by pasting on the base Si target used for sputtering. The contents of Fe, Si, and Al in the EPMA films were 25.8 at.%, 66.2 at.%, and 8.0 at.%, respectively. The results of XRD and TEM showed that Fe 25.8 Si 66.2 Al 8.0 No crystal information was found in the sample, indicating that an amorphous film was prepared. The band gap width was measured to be 0.50 eV.

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Abstract

The invention discloses a Fe-Si-Al ternary amorphous thin film with adjustable band gap width and a preparation method of the thin film, belonging to the technical field of semiconductor materials. The thin film comprises the following formula: Fe(1-x-y)SixAly, wherein x is not lower than 50at.% and not higher than 70at.%; y is not lower than 1at.% and not higher than 11at.%; when the total amount of (x+y) is changed to 75at.% from 60at.%, the band gap width of the thin film can be adjusted to 0.65eV from 0.45eV; and the structure of the thin film is an amorphous structure. The film has the following advantages that (1), the Fe(1-x-y)SixAly thin film is a ternary amorphous thin film with adjustable band gap width from 0.45 eV to 0.65eV; Al not only affects the band gap width, but also increases the amorphous forming ability by increasing a component element film; (2), the total amount of (Si+Al) in the film can be conveniently adjusted by changing the quantity of Fe4Alz alloy sheets and the z value in a combined sputtering target to obtain different band gap widths; (3), the thin film is kept amorphous, so that the uniformity of the components and performances can be ensured, and the problems such as lattice mismatch, and multi-phase mixing and the like in the amorphous thin film preparation are effectively avoided. The Fe-Si-Al ternary amorphous thin film with adjustable band gap width provided by the invention is suitable for manufacturing narrow band-gap semiconductor apparatuses such as an infrared detector.

Description

technical field [0001] The invention relates to an Fe-Si-Al ternary amorphous film with adjustable band gap width and a preparation method thereof, belonging to the technical field of semiconductor materials. Background technique [0002] Semiconductor metal silicides are one of the materials used in solar cells. They have excellent compatibility with single crystal silicon technology, and have metal conductivity, high thermal stability, oxidation resistance and superior mechanical stability. Silicides have also attracted great interest due to their superior environmental friendliness, especially the transition metal silicide β-FeSi 2 , its raw materials Fe and Si are both rich and non-toxic, and can synthesize various relatively safe devices. More importantly, β-FeSi 2 It has a direct band gap of 0.83~0.87eV, and has a large optical absorption coefficient for infrared wavelengths (α > 10 -5 cm -1 ,1.0eV), the theoretical photoelectric conversion efficiency can reach ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): C23C14/14C23C14/35
Inventor 李晓娜郑月红董闯
Owner DALIAN UNIV OF TECH
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