Algan/gan HEMT device structure and fabrication method based on depletion type trench gate
A device structure, depletion-mode technology, applied in the field of microelectronics, to achieve the effect of increasing the operating frequency, improving the control effect, and sacrificing the characteristics of high voltage
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[0031] Hereinafter, the invention will now be described more fully with reference to the accompanying drawings, in which various embodiments are shown. However, this invention may be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art.
[0032] Hereinafter, exemplary embodiments of the present invention will be described in more detail with reference to the accompanying drawings.
[0033] refer to figure 1 , the device of the present invention includes a substrate, an intrinsic GaN layer, an AlN spacer layer, an AlGaN barrier layer (intrinsic AlGaN layer), an AlGaN doped layer, a gate electrode, a source electrode, a drain electrode, an insulating layer, a passivation layer, and Silicide for adjusting the electric field of the channel. The AlGaN dop...
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