Unlock instant, AI-driven research and patent intelligence for your innovation.

Algan/gan HEMT device structure and fabrication method based on depletion type trench gate

A device structure, depletion-mode technology, applied in the field of microelectronics, to achieve the effect of increasing the operating frequency, improving the control effect, and sacrificing the characteristics of high voltage

Inactive Publication Date: 2016-08-17
XIDIAN UNIV
View PDF3 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

AlGaN / GaN heterojunction electron mobility transistors can achieve very high frequencies, but often at the expense of high voltage withstand characteristics

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Algan/gan HEMT device structure and fabrication method based on depletion type trench gate
  • Algan/gan HEMT device structure and fabrication method based on depletion type trench gate
  • Algan/gan HEMT device structure and fabrication method based on depletion type trench gate

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0031] Hereinafter, the invention will now be described more fully with reference to the accompanying drawings, in which various embodiments are shown. However, this invention may be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art.

[0032] Hereinafter, exemplary embodiments of the present invention will be described in more detail with reference to the accompanying drawings.

[0033] refer to figure 1 , the device of the present invention includes a substrate, an intrinsic GaN layer, an AlN spacer layer, an AlGaN barrier layer (intrinsic AlGaN layer), an AlGaN doped layer, a gate electrode, a source electrode, a drain electrode, an insulating layer, a passivation layer, and Silicide for adjusting the electric field of the channel. The AlGaN dop...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a depletion-type grating AlGaN / GaN HEMT structure and a manufacturing method thereof. The structure and the manufacturing method enable an existing AlGaN / GaN HEMT to obtain high frequency. The structure comprises a substrate, an intrinsic GaN layer, an AlN isolation layer, an intrinsic AlGaN layer, an AlGaN doping layer, a gate electrode, a source electrode, a drain electrode, an insulation layer, a passivating layer and silicide used for adjusting channel electric fields. The AlGaN doping layer is located on the upper portion of the intrinsic AlGaN layer, the electrode layers and the insulation layer are located on the upper portion of the AlGaN layer, and the silicide is located on the upper portion of the insulation layer. A depletion-type AlGaN / GaN heterojunction material grows on the substrate in an epitaxy mode. A grating, the source electrode and the drain electrode are formed on the structure, then the insulation layer is deposited, and the silicide including NiSi, TiSi2 and the like is formed on the insulation layer between a gate drain area and a gate source area. Ultimately, the passivating layer is deposited and passivating of a component is achieved. The structure has the advantages of being high in frequency, process repeatability and controllability, low in on resistance and high in work frequency.

Description

technical field [0001] The invention belongs to the technical field of microelectronics and relates to the manufacture of semiconductor devices, in particular to an AlGaN / GaN HEMT device structure and manufacturing method based on a depletion-type trench gate structure, which can be used to manufacture low-on-resistance, high-frequency depletion-type High Electron Mobility Transistors. Background technique [0002] In recent years, the third bandgap semiconductor represented by SiC and GaN has the characteristics of large bandgap, high breakdown electric field, high thermal conductivity, high saturated electron velocity and high concentration of two-dimensional electron gas at the heterojunction interface. It has received widespread attention. In theory, high electron mobility transistor HEMT, light emitting diode LED, laser diode LD and other devices made of these materials have obvious superior characteristics than existing devices, so in recent years, researchers at home...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01L29/778H01L29/423H01L29/10H01L21/335
CPCH01L29/42316H01L29/66462H01L29/778
Inventor 冯倩杜锴代波张春福梁日泉张进成郝跃
Owner XIDIAN UNIV