BRDF quick measuring device based on hemisphere array detection

Abstract

The invention discloses a BRDF quick measurement device based on hemisphere array detection. The BRDF quick measurement device consists of a laser, a fiber beamsplitter, a light power meter, a two-dimensional adjustment and laser collimation mechanism, a fully-closed hemisphere darkroom, an array photoelectric detector, a data collecting and processing system and an upper computer. According to the invention, complicated mechanical structures and electromechanical control systems are omitted, so that the structure is simple and the operation is convenient; the hemispherical fully-closed design is provided with the darkroom experiment environment, so that the system environmental adaptability is improved; through intensive array detection in the hemispherical space, the bidirectional reflectance distribution functions of all sampling angles of the reflective hemispherical space of a material to be tested can be measured quickly at one time within 2 seconds, so that the measurement efficiency is improved; complicated optical systems are not provided, the simple universal model that only the photoelectric detector and a high-speed digital circuit acquisition module are adopted is used for quick collecting and processing of multiple signals, so that the cost is relatively low.

Description

technical field [0001] The invention relates to the field of measurement of optical scattering characteristics of materials, in particular to a BRDF fast measurement device based on hemispherical array detection. Background technique [0002] With the development of military aerospace technology, more and more scholars are paying attention to the light scattering characteristics of space targets. Especially with the development of laser technology, research on laser scattering and radiation characteristics of space targets is carried out. Space penetration technologies such as identification and target stealth have very important application value. [0003] The ability of the target to scatter the laser light incident on it is obviously related to the type of target surface material, surface roughness and the geometric structure of the target. In optics, the reflection of light on a surface is generally divided into two categories, namely specular reflection and diffuse ref...

AI Technical Summary

Problems solved by technology

[0012] The first type of device is characterized by a large response range of the detector, and the accurate measurement of the reflected light radiation flux of the surface along any angle can be realized by cooperating with the follow-up circuit; the disadvantage is that it takes a lot of time, although the use of computer-controlled automatic scanning can improve the measurement speed, but The mechanical system and motor control system are complex, and the time for measurement and data processing is too long

[0013] The most typical representative product in the second type of device uses optical fiber to couple the incident light to the surface of the material to be tested, and the reflected light radiation flux from various angles is received by optical fiber coupling and projected onto the scattering screen, and finally imaged by the optical imaging CCD Collect and use the image processing method to calculate the light intensity distribution at different angles. This method can simultaneously collect scattered light in the space, and the measurement is fast and easy to operate. The disadvantage is that the optical system is very complicated, the initial investment is large and the cost is high

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