Optical waveguide devices
一种器件、脊部的技术,应用在光波导器件领域,能够解决传播损失变大、难加工台横向移动等问题,达到抑制传播损失的效果
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Embodiment 1
[0078] make figure 1 , Figure 4 (a) and Figure 5 Documented device 1.
[0079] Specifically, a dielectric layer 3 (thickness 2.0 μm) / SiO made of lithium niobate doped with MgO 2 A laminated body of the support substrate 2 with a thickness of .5 mm consisting of the clad layer / adhesive layer / Y plate not doped with lithium niobate. On this dielectric layer 3, Ta 2 o 5 membrane.
[0080] Next, a molybdenum film having a thickness of 100 nm was formed on the upper surface 3 a of the dielectric layer 3 and the bottom surface of the support substrate 2 . Next, a resist pattern is formed on the dielectric layer and the molybdenum film by photolithography (resist coating and development). In addition, a resist is applied to the entire bottom surface of the support substrate 2 . Next, the molybdenum film was wet-etched to remove the resist, and a pattern made of the molybdenum film was formed.
[0081] Next, the laminated body was dipped in 50% HF whose temperature was adjus...
Embodiment 2
[0098] A device was produced in the same manner as in Example 1. However, the material of the dielectric layer 3 is a lithium tantalate single crystal doped with MgO. As a result, the same result as in Example 1 was obtained. In addition, as a result of the tape test, it was confirmed that no film was attached to the tape and no ridges were peeled off from the device.
Embodiment 3
[0100] A device was produced in the same manner as in Example 1. However, the material of the dielectric layer 3 is yttrium vanadate crystal. In order to confirm the performance of the optical waveguide, the propagation loss at a wavelength of 980 nm was measured in the same manner as in Example 1, and the result was 0.5 dB / cm. In addition, as a result of the tape test, it was confirmed that no film was attached to the tape and no ridges were peeled off from the device.
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