Piezoelectric element, manufacturing method of piezoelectric element, piezoelectric actuator, inkjet head, and inkjet printer
A piezoelectric actuator, piezoelectric element technology, applied in piezoelectric devices/electrostrictive devices, electrical components, piezoelectric/electrostrictive/magnetostrictive devices, etc. Deterioration of electrical characteristics, etc.
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Embodiment 1、2
[0086] The surface roughness of the lower electrode 24 is set to RMS 3-4nm, and the RF power of the cathode during PZT film formation is 34W / cm 2 , the film-forming temperature is not less than 550°C and not more than 600°C, and the ratio of the flow rate of oxygen to the flow rate of argon is not less than 2% and not more than 3%. In addition, the film formation rate of PZT is not less than 1.5 μm / hr and not more than 3 μm / hr.
Embodiment 3、4
[0088] The surface roughness of the lower electrode 24 is set to RMS 2 to 3 nm. The film-forming conditions of PZT are the same as in Examples 1 and 2.
[0089] The PZT (piezoelectric thin film 25 ) produced under the respective film formation conditions of Comparative Examples 1 to 4 and Examples 1 to 4 was evaluated by XRD. Figure 6 The spectrum obtained when XRD 2θ / θ measurement is performed on the piezoelectric thin film 25 produced in Example 4 is shown, for example. also, Figure 6 The intensity (diffraction intensity, reflection intensity) on the vertical axis of , is expressed in an arbitrary unit (Arbitary Unit) corresponding to the count rate per second (cps; count per second) of X-rays. From the peak intensities obtained from such spectra, the peak intensity ratio P of the (100) orientation of the perovskite phase was obtained. 1 , (110) orientation peak intensity ratio P 2 , (111) orientation peak intensity ratio P 3 , the peak intensity ratio of pyrochlore l...
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