Method for measuring microwave electric field by utilizing double-dark state system
A dark state system and microwave technology, applied in electrostatic field measurement and other directions, can solve the problems of complex cooling device structure and limited measurement accuracy, and achieve the effect of improving detection accuracy and narrowing transmission peak linewidth.
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[0020] The present invention will be further described below in conjunction with the drawings and embodiments.
[0021] The structure, ratio, size, etc. shown in the drawings in this specification are only used to match the content disclosed in the specification for the understanding and reading of those familiar with the technology, and are not used to limit the implementation of the present invention. Therefore, it has no technical significance. Any structural modification, proportional relationship change, or size adjustment should still fall within the scope of the present invention without affecting the effects and objectives that can be achieved by the present invention. The technical content must be covered. At the same time, the terms such as "upper", "lower", "left", "right", "middle" and "one" cited in this specification are only for the convenience of description and are not used to limit the text. The scope of implementation of the invention, the change or adjustment...
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