Etchant composition and manufacturing method of array substrate for display device
A technology of composition and etching solution, which is applied in the direction of surface etching composition, chemical instruments and methods, instruments, etc., can solve the problems of interface erosion and other problems when etching multilayer films, and achieve the characteristics of excellent etching profile and lateral etching variation excellent effect
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Embodiment 1~9 and comparative example 1~8
[0094] Examples 1-9 and Comparative Examples 1-8. Preparation of Etching Solution Composition
[0095] 180 kg of etching liquid composition was manufactured according to the composition and content (weight%) described in the following Table 1.
[0096] [Table 1]
[0097]
[0098] Note) In the above table 1,
[0099] NHP: sodium dihydrogen phosphate
[0100] PPM: potassium dihydrogen phosphate
[0101] APM: Ammonium Phosphate
[0103] PS: potassium sulfate
[0104] AS: Ammonium sulfate
[0105] TEG: Triethylene glycol (triethylene glycol)
[0106] Phosphite: sodium phosphite (sodium phosphite)
experiment example
[0107] Evaluation of Etching Properties of Etching Solution Composition
[0108] The etching process was implemented using the etching liquid composition of Examples 1-9 and Comparative Examples 1-8, respectively. The temperature of the etchant composition in the etching process was set to about 33° C. using a spray etching method experimental device (model name: ETCHER (TFT), SEMES). The etching time may vary depending on the etching temperature, but is usually performed at about 110 seconds. The profile cross section of the copper-based metal film etched in the above etching step was examined by SEM (Hitachi Corporation, model name S-4700), and the results are shown in Table 2 below.
[0109] The test piece (Cu / MoNb) used in the etching process used the following test piece: a molybdenum-niobium alloy film was deposited on a glass substrate (100mm×100mm), and a copper film was deposited on the above film, followed by a photolithography process. , forming a photoresist wit...
experiment example 1
[0110] Experimental example 1. Etching rate evaluation
[0111] Measure the end point detection (End Point Detection, EPD) with naked eyes, and obtain the etching rate (E / R, Etch Rate) at different times, and the etching rate is only evaluated by the vertical etching rate. If the thickness of the etched metal film is divided by the EPD, it can be calculated per second (time) (thickness) The etching rate was evaluated according to the following criteria, and the results are shown in Table 2.
[0112]
[0113] ○: good
[0114] Х: Poor (less than or more than )
[0115] Unetch: Unetchable
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