Low-angle offset light filter based on boron-doped silane and preparing method of low-angle offset light filter
A technology of boron doping and silicon hydride, which is applied in the field of optical filters, can solve the problem of large angular shift of the center wavelength of optical filters, etc., and achieve the effects of small passband bandwidth, improved signal-to-noise ratio, and large field of view
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[0040] A method for preparing a low-angle shift optical filter based on boron-doped silicon hydride, comprising the following steps:
[0041] Step A, preparing the first coating layer
[0042] (A1) Preparation of boron-doped hydrogenated silicon layer
[0043] There are mainly two ways:
[0044] Approach 1: In the magnetron sputtering equipment, the silicon target is used as the sputtering target for sputtering, and argon, hydrogen and boron-containing gas are introduced, and the boron-containing gas is mixed with argon and hydrogen, and both argon and hydrogen are high Pure gases, boron-containing gases including BH 4 , B 2 h 6 As well as other boron-containing compounds, a boron-doped silicon hydride layer is plated on one side of the substrate 1 or on the opposite two sides by magnetron sputtering, wherein the concentration of the boron-containing gas is 0.0001ppm to 10000ppm, preferably, The concentration of the boron-containing gas is 0.1 ppm-1000 ppm, more preferabl...
Embodiment 1
[0061] Such as Figure 1-2 As shown, the low-angle shift filter based on boron-doped hydrogenated silicon includes a glass substrate 1, a first coating layer 2 and a second coating layer 3, and the substrate 1 is arranged on the first coating layer 2 and the second coating layer Between the layers 3, the first coating layer 2 is prepared with alternating boron-doped silicon hydride and silicon dioxide as the coating material, and the second coating layer 3 is prepared with alternating boron-doped silicon hydride and silicon dioxide as the coating material As a high refractive index material, boron-doped silicon hydride has a refractive index between 3.0 and 4.0, an extinction coefficient between 0.01 and 0.00001, and silicon dioxide (SiO 2 ) as a low refractive index material reduces the central wavelength angle shift of the filter, wherein the first coating layer 2 is sequentially deposited from the inside to the outside by a total of 36 layers of boron-doped hydrogenated sil...
example 2
[0073] Step A, preparing the first coating layer
[0074] (A1) Preparation of boron-doped hydrogenated silicon layer
[0075] DC magnetron sputtering is adopted, the sputtering target uses high-purity silicon target, and B 2 h 6 Gas, mixture of hydrogen and argon, B 2 h 6 The gas concentration is 130ppm, a boron-doped hydrogenated silicon layer is formed on one side of the substrate 1, the sputtering power is 8kW, and the power pulse frequency is 130kHz.
[0076] (A2) Preparation of silicon dioxide layer
[0077] When preparing a low-refractive-index silicon dioxide layer, a high-purity silicon target is used as a sputtering target, and oxygen gas is introduced during sputtering to form silicon oxide, which is sputtered onto the boron-doped hydrogenated silicon layer in step (A1), and then sequentially Step (A1) and step (A2) are repeated to prepare the first coating layer 2 .
[0078] The rest are the same as embodiment 1.
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