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Preparation method for specimen used for measuring silicon contents in ferrosilicon by X-ray fluorometric analysis method

A technology of X-ray and analytical method, which is applied in the field of sample preparation, can solve the problems of repeated high-life use of experimental utensils, increase of repetitive process, and increase of inspection and testing costs, so as to improve the reuse rate and reduce waste Samples, the effect of improving the utilization rate of personnel

Inactive Publication Date: 2018-11-30
唐山瑞丰钢铁(集团)有限公司
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Problems solved by technology

[0005] Glass dissolution method, lithium tetraborate wall pre-oxidation method, centrifugal casting method, and melting method after mixed acid treatment: these can eliminate the influence of particle size effect and matrix effect, and improve the accuracy of analysis results, but these methods are in the process of implementation There is a reaction between metal and other reducing substances in the material and platinum at high temperature, corroding the platinum crucible, and repeated high-life use of the experimental utensils cannot be achieved. Even if there is a protection step of using lithium tetraborate on the wall in these methods, the platinum crucible still exists once. In addition, the price of platinum crucible is relatively expensive. Serious corrosion of platinum crucible causes interruption of experimental operation, re-preparation of materials used in samples, and increased repetitive process, which virtually increases the cost of testing and testing.

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  • Preparation method for specimen used for measuring silicon contents in ferrosilicon by X-ray fluorometric analysis method
  • Preparation method for specimen used for measuring silicon contents in ferrosilicon by X-ray fluorometric analysis method
  • Preparation method for specimen used for measuring silicon contents in ferrosilicon by X-ray fluorometric analysis method

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Embodiment Construction

[0026] In order to make the technical problems to be solved by the present invention, the technical means adopted, and the beneficial effects achieved more clearly, the present invention will be described in detail below in conjunction with the accompanying drawings and embodiments.

[0027] A method for preparing a sample for X-ray fluorescence analysis to measure silicon content in ferrosilicon, carried out in the following steps:

[0028] a. Primary ingredients: see figure 1 , place the prepared filter paper 1 in the electronic balance and remove the tare weight, then weigh 0.8 parts of boric acid 2 and 2 parts of anhydrous sodium carbonate 4 in sequence on the filter paper 1 and stir evenly to form a mixed oxidant; add 0.2 parts of silicon The iron sample 3 is placed in the middle of the upper part of the mixed oxidant, and then completely covered with the mixed oxidant. After the batching is completed, filter paper 1 is used to wrap the sample into a spherical shape.

[...

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Abstract

The invention relates to a preparation method for a specimen used for measuring silicon contents in ferrosilicon by an X-ray fluorometric analysis method. The preparation method comprises the following steps of primary burdening, pre-oxidation, secondary burdening and fusion. In primary burdening, filter paper and mixed oxidizing agent are used for coating a ferrosilicon specimen, and the specimenis coated into a sphere; in pre-oxidation, a crucible is full of graphite, the spherical specimen is put into a graphite pit, and then, the spherical specimen is oxidized in a high-temperature mufflefurnace to obtain an elliptical specimen; in secondary burdening, ammonium iodide release agent is laid in a platinum vessel, the cooled elliptical specimen is placed and is covered with lithium borate and metaboric acid mixed fusing agent; and in fusion, the platinum vessel is put in a piece fusion machine and is subjected to fusion at the temperature of 900-1050DEG C for 19min to obtain the fused piece, i.e., the specimen, and the specimen can be directly used for an X-ray spectrum analyzer for analysis. By use of the method, various specimens can be simultaneously manufactured, in addition, process controllability is simple, time consumed for experiments is short, manufacture cost is low, and an X-ray fluorometric analysis result is high in accuracy.

Description

technical field [0001] The invention relates to a method for measuring silicon content in ferrosilicon by X-ray fluorescence analysis, in particular to a method for preparing a sample used for measuring silicon content in ferrosilicon by X-ray fluorescence analysis. Background technique [0002] Ferrosilicon is an important raw material for steelmaking, and its chemical composition detection is one of the important links to ensure steelmaking process control and quality control. At present, the national standard method for determining the silicon content in ferrosilicon is the perchloric acid dehydration gravimetric method, but this method is cumbersome to operate, is greatly affected by other interfering elements, and the analysis time is about 1 day. Therefore, technicians in the industry are looking for an efficient and fast method to analyze the silicon content in ferrosilicon. [0003] Zhou Honghong and Cao Zhonglie's "Determination of Silicon in Ferrosilicon" proposed...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/2202G01N23/223
CPCG01N23/2202G01N23/223
Inventor 齐超群郑昌清高三军李雪松张宁张娜韩爱丽黄正一李宏亮
Owner 唐山瑞丰钢铁(集团)有限公司
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