Preparation method for specimen used for measuring silicon contents in ferrosilicon by X-ray fluorometric analysis method
A technology of X-ray and analytical method, which is applied in the field of sample preparation, can solve the problems of repeated high-life use of experimental utensils, increase of repetitive process, and increase of inspection and testing costs, so as to improve the reuse rate and reduce waste Samples, the effect of improving the utilization rate of personnel
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[0026] In order to make the technical problems to be solved by the present invention, the technical means adopted, and the beneficial effects achieved more clearly, the present invention will be described in detail below in conjunction with the accompanying drawings and embodiments.
[0027] A method for preparing a sample for X-ray fluorescence analysis to measure silicon content in ferrosilicon, carried out in the following steps:
[0028] a. Primary ingredients: see figure 1 , place the prepared filter paper 1 in the electronic balance and remove the tare weight, then weigh 0.8 parts of boric acid 2 and 2 parts of anhydrous sodium carbonate 4 in sequence on the filter paper 1 and stir evenly to form a mixed oxidant; add 0.2 parts of silicon The iron sample 3 is placed in the middle of the upper part of the mixed oxidant, and then completely covered with the mixed oxidant. After the batching is completed, filter paper 1 is used to wrap the sample into a spherical shape.
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