Method of manufacturing chemical vapor deposition high-purity tungsten sputtering target material

A technology of chemical vapor deposition and production method, which is applied in the field of high-purity tungsten sputtering target production, which can solve the problems of poor quality consistency, easy pollution of the surface, and low purity of blanks, so as to achieve non-pollution, easy control of the production process, and simple process Effect

Inactive Publication Date: 2019-04-12
苏州鑫沣电子科技有限公司
View PDF4 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In view of the deficiencies in the prior art, the purpose of the present invention is to provide a chemical vapor deposition high-purity tungsten sputtering target manufacturing m

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0021] A method for manufacturing a chemical vapor deposition high-purity tungsten sputtering target, comprising the following steps:

[0022] (1) Preparation of raw materials: tungsten hexafluoride in the gaseous state at normal temperature and pressure is used as the raw material;

[0023] (2) Preparation of high-purity metal tungsten: use chemical vapor deposition equipment to reduce tungsten hexafluoride to high-purity metal tungsten with reducing gas;

[0024] (3) Deposit the high-purity metal tungsten obtained in step (2) on the base material, and produce high-purity tungsten target or tungsten target blank in one step.

[0025] Wherein, the tungsten hexafluoride in the step (1) is tungsten hexafluoride with a purity of more than 99.999%, and generally the reaction temperature of tungsten hexafluoride vapor-phase deposited metal tungsten is 550-650°C.

[0026] Specifically, the high-purity metal tungsten obtained in step (2) is deposited on the tungsten target material ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a method of manufacturing a chemical vapor deposition high-purity tungsten sputtering target material. The method comprises the following steps that (1) raw materials are prepared, tungsten hexafluoride which is in gaseous state at normal temperature and normal pressure is taken as a raw material; (2) the high-purity metal tungsten is prepared, the tungsten hexafluoride isreduced into the high-purity metal tungst by using a reducing gas through chemical vapor deposition equipment, the tungsten hexafluoride is reduced into high-purity metal tungsten by using the reducing gas; and (3) and the high-purity metal tungsten obtained in the step (2) is deposited on a matrix material, a one-step method is used for producing the high-purity tungsten target material or the tungsten target material blank material. According to the method, the problems that an existing tungsten target material is low in purity and not easy to process, the surface is easy to pollute, the quality consistency is poor are solved, the vapor deposition reaction is a continuous gaseous reaction, the reaction process is uniform, and the product consistency is good; the one-step method is adopted to prepare the tungsten target material, secondary machining pollution is avoided, it is beneficial to guaranteeing the quality of the tungsten target product, and the production cost is low.

Description

technical field [0001] The invention relates to a method for manufacturing a high-purity tungsten sputtering target material for chemical vapor deposition, in particular to a method for manufacturing a high-purity tungsten sputtering target material for forming a thin film for a diffusion contact layer of a large-scale integrated circuit. Background technique [0002] Large-scale integrated circuits often use tungsten targets for vacuum sputtering, especially large-scale high-purity tungsten targets. In the current semiconductor integrated circuit field, the purity of tungsten targets is 99.995%-99.999%, and the diameter is 300-450mm, thickness 5-15mm. However, with the development of the semiconductor industry, large-scale integrated circuits put forward higher requirements for tungsten targets. [0003] Tungsten is a refractory and difficult-to-process metal. The powder metallurgy method is generally used to make tungsten targets in the industry. The powder metallurgy pro...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): C23C16/14C23C14/34
CPCC23C14/3414C23C16/14
Inventor 刘洋刘瑞
Owner 苏州鑫沣电子科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products