Device and method for measuring strain tensor of two-dimensional material based on optical third harmonic generation
A two-dimensional material and strain tensor technology, applied in the field of spectroscopy and optoelectronics, can solve problems such as center inversion breaking, and achieve fast measurement speed
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Embodiment 1
[0024] The measurement of the local strain tensor in single-layer tungsten disulfide by optical triple frequency includes the following steps:
[0025] 1) if figure 1 As shown, the optical path includes a pulsed laser light source 1, a mirror 2, a first polarizer 3, a beam splitter 4, a 1 / 2 wave plate 5, a lens 6, a two-dimensional sample to be measured 7, a second polarizer 8, a filter Sheet 9, spectrometer 10. Among them, the pulse laser light source 1 has a wavelength of 1288nm, and the two-dimensional material sample to be tested is a single-layer tungsten disulfide.
[0026] Along the light emitting direction of the light source, the light source, the reflector, the first polarizer, the 1 / 2 wave plate, the beam splitter, the lens, and the measured two-dimensional material sample And its substrate, the lens, the beam splitter, the filter, the second polarizer, and the spectrometer are set in sequence.
[0027] 2) At the focal point of the lens 6, place a single layer of...
Embodiment 2
[0039] The measurement of the strain tensor distribution in the monolayer tungsten disulfide by optical triple frequency includes the following steps:
[0040] 1) if figure 1 As shown, the optical path includes a pulsed laser light source 1, a mirror 2, a first polarizer 3, a beam splitter 4, a 1 / 2 wave plate 5, a lens 6, a two-dimensional sample to be measured 7, a second polarizer 8, a filter Sheet 9, spectrometer 10. Among them, the pulsed laser light source 1 has a wavelength of 1288nm, and the two-dimensional material sample to be measured is a single-layer tungsten disulfide, which is placed on a two-dimensional piezoelectric displacement platform.
[0041] Along the light emitting direction of the light source, the light source, the reflector, the first polarizer, the 1 / 2 wave plate, the beam splitter, the lens, and the measured two-dimensional material sample And its substrate, the lens, the beam splitter, the second polarizer, the filter, and the spectrometer are se...
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