Unlock instant, AI-driven research and patent intelligence for your innovation.

Double-top-layer metal CMOS process of device under bonding pad

A top metal and pad technology, applied in the field of double top metal CMOS process, can solve problems such as inability to realize DUP, and achieve the effects of controllable cost, improved flexibility, and wide application range

Active Publication Date: 2020-01-24
XIAN MICROELECTRONICS TECH INST
View PDF8 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] To sum up, in the 0.13-3μm CMOS process, products with fewer metal layers cannot achieve DUP

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Double-top-layer metal CMOS process of device under bonding pad
  • Double-top-layer metal CMOS process of device under bonding pad
  • Double-top-layer metal CMOS process of device under bonding pad

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0075] Example 1, 3μm silicon gate CMOS double top layer metal process

[0076] Modify the design rules to allow DUP. When designing, place the active area of ​​the circuit CMOS device and the polycrystalline pattern under the metal 1 pad to realize DUP, and follow the steps below to tape out.

[0077] Step 1, forming an active region,

[0078] Use an N-type doped wafer with a resistivity of 1 Ohm cm and a crystal orientation of (100) as the silicon substrate. The resistivity corresponds to a higher doping concentration. pad oxygen and The silicon nitride, then, define the field area by photolithography and etching silicon nitride, the area where the silicon nitride is etched will form the field area in the future, the area covered by silicon nitride is the active area, and the active area is divided into The active area of ​​NMOS and the active area of ​​PMOS;

[0079] Step 2, forming a P well,

[0080]Through photolithography and implantation, a P well is formed in th...

Embodiment 2

[0095] Example 2, 0.5 μm silicon gate CMOS double top layer metal process

[0096] Modify the design rules to allow DUP. When designing, place the CMOS device with a complete circuit, including the active area, polycrystalline, hole and metal 1 pattern, under the metal 2 pad to realize DUP, and tape it out according to the following steps.

[0097] Step 1, forming an active region,

[0098] Using a P-type doped wafer with a resistivity of 20 Ohm·cm and a crystal orientation of (100) as the silicon substrate, firstly grow the wafer with a thickness of pad oxygen and The silicon nitride, then, define the field area by photolithography and etching silicon nitride, the area where the silicon nitride is etched will form the field area in the future, the area covered by silicon nitride is the active area, and the active area is divided into The active area of ​​NMOS and the active area of ​​PMOS;

[0099] Step 2, forming N well and P well,

[0100] Through photolithography an...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
thicknessaaaaaaaaaa
Login to View More

Abstract

The invention relates to a double-top-layer metal CMOS process of a device under a bonding pad. The process is characterized in that an active region is formed on a silicon substrate, a P well is formed on the active region of an NMOS, an N well is formed on the active region of a PMOS, a field oxide layer is formed, threshold injection is performed, a gate oxide layer and a polycrystalline gate are formed, a passivated and etched silicon substrate is obtained according to the silicon gate CMOS (Complementary Metal-Oxide-Semiconductor Transistor) process of 0.13-0.8 mu m and a silicon gate CMOS process of more than 0.8 mu m and less than 3 mu m, the standard-thickness top metal CMOS process is completed, and lastly, the circuit with the thickened metal thickness at the bonding pad is obtained by adding one-time metal deposition, photoetching and etching processes and matching with alloy operation, and the metal thickness of the bonding pad is increased, and the stress existing in the bonding process can be fully buffered. The process is advantaged in that the process is suitable for products with any number of metal layers, the application range is wide, design flexibility is improved, arrangement of a circuit layout is not limited at all, and the area of a chip is reduced.

Description

technical field [0001] The invention relates to the technical field of silicon microelectronics, in particular to the technical field of ultra-large-scale integrated circuit processing, in particular to a double-top-layer metal CMOS process for devices under pads. Background technique [0002] In the large-size CMOS process larger than 3μm, the number of pads is small, and the area occupied in the chip is small. However, as the CMOS process shrinks in proportion to Moore's law, the device size will shrink rapidly, and the bonding process will reduce the size of the device. Due to limitations, the size of pads decreases slowly; at the same time, the complexity of chip functions leads to an increase in the number of input and output pads, so the area occupied by pads in the chip is getting larger and larger. For the 0.13-3μm CMOS process, the thickness of the top layer metal is about 0.9-1.5μm, which cannot buffer the large stress in the bonding process. Therefore, the design ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/8238H01L21/60H01L27/092
CPCH01L21/823871H01L24/03H01L24/05H01L27/0928H01L2224/0361H01L2224/05124H01L2224/05147
Inventor 陈晓宇曹磊赵杰孙有民
Owner XIAN MICROELECTRONICS TECH INST