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Transmission electron microscope sample preparation method suitable for dissimilar material welding joint interface analysis

A technology of dissimilar materials and welded joints, which is applied in the direction of material analysis using radiation, material analysis using wave/particle radiation, and material analysis. The effect of low cost and short time consumption

Inactive Publication Date: 2020-09-04
SHANGHAI JIAO TONG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The purpose of the present invention is to solve the problem of difficulty and high cost of sample preparation for transmission electron microscope at the interface of welded joints of different materials, and to provide a sample preparation method for transmission electron microscope suitable for the analysis of the interface of welded joints of different materials

Method used

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  • Transmission electron microscope sample preparation method suitable for dissimilar material welding joint interface analysis
  • Transmission electron microscope sample preparation method suitable for dissimilar material welding joint interface analysis
  • Transmission electron microscope sample preparation method suitable for dissimilar material welding joint interface analysis

Examples

Experimental program
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Effect test

Embodiment 1

[0042] Using ion thinning technology to carry out transmission electron microscope sample preparation on welded joints of aluminum and steel dissimilar materials, the specific steps are as follows:

[0043] (a), if figure 1 , the form of the welded joint of dissimilar materials is a lap joint, and the sample of the welded joint of dissimilar materials is prepared by wire cutting into a plane size greater than or equal to 20mm╳6mm, and the initial sample is a uniform thin sheet with a thickness of about 1.0mm, so that the base metal of aluminum and steel accounts for each Half the area, and symmetrical to the weld, such as figure 2 , 3 .

[0044] (b) Put the initial wire-cut sample into an acetone solution, and clean it with ultrasonic vibration to remove surface oil.

[0045] (c) Stick the sample on a metal or glass substrate of appropriate size, and perform manual flat grinding on sandpaper. When grinding, use force on the steel side and light force on the aluminum side,...

Embodiment 2

[0057] The transmission electron microscope sample preparation method for the interface analysis of welded joints of dissimilar materials, the specific steps refer to Example 1, the differences are as follows:

[0058] In step (c), the sample is ground into a uniform sheet with a thickness of about 50 μm.

[0059] In step (f), the speed of the grinding wheel is in 3rd gear, and the sample rotation speed is in 3rd gear.

[0060] In step (g), the grinding pressure is set to 20g during the pit.

[0061] In step (i), the sample is first ground to a range of 20 μm using a fine grinding paste with 3-6 μm particles. At this thickness, replace the abrasive paste of 0.5 μm for continuous polishing, so that the remaining thickness of the sample is 10 μm.

[0062] In step (j), the ion gun angle is set to 8°, the acceleration energy is set to 5keV, the sample rotation speed is 3rpm, and the current readings of the left and right ion guns need to be greater than 6μA.

[0063] In step (l...

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Abstract

The invention relates to a transmission electron microscope sample preparation method suitable for dissimilar material welding joint interface analysis. The method comprises the step of sequentially carrying out grinding, punching, pit thinning and ion thinning treatment on a dissimilar material welding joint sample capable of identifying an interface to obtain a transmission electron microscope experimental sample capable of observing welding fusion area interface microstructure, crystal structure and component analysis. According to the method, the ion thinning technology is used for preparing the dissimilar material welding joint sample difficult to prepare; the operation method is simple and easy to implement; the sample preparation efficiency is improved; the sample preparation process is simple; the cost is low; the success rate is high; and a new solution is provided for transmission electron microscope sample preparation of the dissimilar material welding joint with the interface capable of being recognized by naked eyes.

Description

technical field [0001] The invention belongs to the technical field of material transmission electron microscope sample preparation, and in particular relates to a transmission electron microscope sample preparation method suitable for interface analysis of welded joints of dissimilar materials. Background technique [0002] Using transmission electron microscopy to analyze the microstructure and crystal structure of materials, it is necessary to prepare electron microscopy samples of moderate size and thickness. The fusion area of ​​the welded joint of dissimilar materials is small, and it is often very difficult to prepare samples suitable for TEM observation. [0003] Generally speaking, in order to accurately locate the interface position of the welding joint of dissimilar materials, the method of in-situ cutting with focused ion beam is usually used. Gallium ions. After acceleration, the high-energy ion beam collides with the sample and sputters to achieve the purpose...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/04G01N23/2005G01N1/28
CPCG01N1/286G01N23/04G01N23/2005G01N2001/2866
Inventor 马晓丽刘礼王立强
Owner SHANGHAI JIAO TONG UNIV
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