Integrated Optical Autocorrelator Based on Transverse Double Frequency Effect of Two-dimensional Materials
An integrated optics and autocorrelator technology, applied in optics, optical components, nonlinear optics, etc., can solve the problems of large insertion loss of devices, high requirements for delay adjustment accuracy, and poor time resolution, and achieve a high degree of integration. High, the effect of eliminating the delay
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment approach
[0022] see figure 1, as the first embodiment of the present invention, the integrated optical autocorrelator based on the transverse double frequency effect of two-dimensional materials includes a substrate 1, an on-chip coupling system, a two-dimensional material film 16, a convex lens 17 and an imaging camera 18; on-chip coupling The system includes a grating coupler 2, a first beam splitter 4, a second beam splitter 6, a third beam splitter 7, a first S-shaped waveguide 8-1, a second S-shaped waveguide 8-2, and a third S-shaped waveguide Waveguide 9-1, fourth S-shaped waveguide 9-2, first arcuate waveguide 13-1, second arcuate waveguide 13-2, third arcuate waveguide 13-3, fourth arcuate waveguide 13-4. The first straight waveguide 14, the second straight waveguide 15 and the delayer 12, wherein the first beam splitter 4, the second beam splitter 6 and the third beam splitter 7 are 50:50 1× 2 beam splitters. The output end of the grating coupler 2 is connected with the inp...
PUM
Property | Measurement | Unit |
---|---|---|
width | aaaaa | aaaaa |
thickness | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
![application no application](https://static-eureka.patsnap.com/ssr/23.2.0/_nuxt/application.06fe782c.png)
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com