Flexible memory based on two-dimensional material
A two-dimensional material and memory technology, applied in the field of non-volatile memory, can solve problems such as gate application, achieve the effect of reducing energy consumption and realizing multi-functionality
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Embodiment 1
[0032] A flexible memory based on two-dimensional materials, including a flexible substrate, and an indium tin oxide layer, an aluminum oxide barrier layer, a nano-graphene layer, an aluminum oxide tunneling layer, and a di Molybdenum sulfide layer, metal electrode;
[0033] The preparation method of the flexible memory based on the two-dimensional material described in embodiment 1 comprises the following steps:
[0034] (1) Deposit indium tin oxide on a flexible substrate by magnetron sputtering to make an indium tin oxide layer with a thickness of 20nm as the bottom electrode;
[0035] (2) Aluminum oxide is deposited on the surface of the indium tin oxide layer as an aluminum oxide barrier layer by atomic layer deposition, and the thickness of the aluminum oxide barrier layer is 20nm;
[0036] (3) Graphene is deposited on the silicon chip that is covered with silicon oxide by the method for plasma chemical vapor deposition, and the silicon chip is covered with the thicknes...
Embodiment 2
[0042] A flexible memory based on two-dimensional materials, including a flexible substrate, and an indium tin oxide layer, an aluminum oxide barrier layer, a nano-graphene layer, an aluminum oxide tunneling layer, and a di Molybdenum sulfide layer, metal electrode;
[0043] The preparation method of the flexible memory based on the two-dimensional material described in embodiment 2 comprises the following steps:
[0044](1) Deposit indium tin oxide on a flexible substrate by magnetron sputtering to make an indium tin oxide layer with a thickness of 30nm as the bottom electrode;
[0045] (2) Aluminum oxide is deposited on the surface of the indium tin oxide layer as an aluminum oxide barrier layer by atomic layer deposition, and the thickness of the aluminum oxide barrier layer is 30nm;
[0046] (3) Graphene is deposited on the silicon chip that is covered with silicon oxide by the method for plasma chemical vapor deposition, and the silicon chip is covered with the thickness...
Embodiment 3
[0052] A flexible memory based on two-dimensional materials, including a flexible substrate, and an indium tin oxide layer, an aluminum oxide barrier layer, a nano-graphene layer, an aluminum oxide tunneling layer, and a di Molybdenum sulfide layer, metal electrode;
[0053] The preparation method of the flexible memory based on the two-dimensional material described in embodiment 3 comprises the following steps:
[0054] (1) Deposit indium tin oxide on a flexible substrate by magnetron sputtering to make an indium tin oxide layer with a thickness of 50 nm as the bottom electrode;
[0055] (2) Aluminum oxide is deposited on the surface of the indium tin oxide layer as an aluminum oxide barrier layer by atomic layer deposition, and the thickness of the aluminum oxide barrier layer is 25nm;
[0056] (3) Graphene is deposited on a silicon wafer covered with silicon oxide by plasma chemical vapor deposition, and the silicon wafer is covered with a thickness of 320nm of silicon ox...
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