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Simulation method for response sensitivity in pixels of infrared focal plane detector array

A technology of response sensitivity and detector array, applied in the field of infrared focal plane detector performance simulation evaluation, can solve the problems of low implementation cost, high efficiency, insufficient response sensitivity mechanism research and theoretical analysis in pixels of infrared focal plane detector array, etc. , to achieve the effect of low implementation cost, high efficiency and improved detection accuracy

Active Publication Date: 2021-03-05
SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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Problems solved by technology

[0005] Purpose of the invention: The present invention provides a simulation method for the response sensitivity within the pixel of an infrared focal plane detector array, which can solve the existing problems of insufficient research on the mechanism and theoretical analysis of the response sensitivity within the pixel of an infrared focal plane detector array, and has low implementation cost , high efficiency and other characteristics

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  • Simulation method for response sensitivity in pixels of infrared focal plane detector array
  • Simulation method for response sensitivity in pixels of infrared focal plane detector array
  • Simulation method for response sensitivity in pixels of infrared focal plane detector array

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[0042] The present invention will be described in detail below in conjunction with specific embodiments. The following examples will help those skilled in the art to further understand the present invention, but do not limit the present invention in any form. It should be noted that those skilled in the art can make several changes and improvements without departing from the concept of the present invention. These all belong to the protection scope of the present invention.

[0043] In order to solve the lack of theoretical analysis of the non-uniformity of the response sensitivity within the pixel of the existing area array infrared detector and the detection accuracy of the high-energy concentrated point target, the embodiment of the present invention provides a simulation method of the response sensitivity within the pixel of the infrared focal plane detector array, which is applied to Classical HgCdTe infrared detectors such as figure 1 As shown, the method includes the ...

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Abstract

The invention provides a simulation method for response sensitivity in pixels of an infrared focal plane detector array. The method mainly comprises the following steps: step 1, designing an infraredfocal plane detector array; step 2, performing optical simulation of a finite difference time domain method to acquire a curve Sopical (x) of a photon generation rate integral value changing along with Gaussian spot scanning position; step 3, performing electrical simulation of a finite element method to acquire a curve Sphotocurrent (x) of light current changing along with Gaussian spot scanningposition; 4, using a Lucy-Richardson deconvolution algorithm for solving an optical crosstalk and diffusion mechanism and an intra-pixel response sensitivity function under the combined action of theoptical crosstalk and diffusion mechanism and the intra-pixel response sensitivity function; and step 5, selecting different parameters for simulation, and analyzing the relationship between the response sensitivity in the pixel and the thickness of the absorption layer, the doping concentration of the absorption layer, the incident wavelength and the pixel size. According to the invention, usefulreference can be provided for actual infrared detector design, in-pixel response sensitivity experimental characterization and infrared point target high-precision detection.

Description

technical field [0001] The invention relates to an infrared focal plane detector array pixel response sensitivity simulation method, which belongs to the technical field of infrared focal plane detector performance simulation evaluation. Background technique [0002] For point target infrared detection systems in the field of astronomy and remote sensing, when the energy distribution of the target is concentrated in a single pixel on the focal plane, the non-uniform response sensitivity within the pixel will lead to a decrease in the accuracy of centroid positioning and energy calculation. Current research on the non-uniformity of response sensitivity within a detector pixel mainly focuses on experimental measurements. In 1998, Kavaldjiev et al. used the numerical aperture objective lens in the scanning microscope device to generate a point light source to measure the response change within the pixel of the front-illuminated CCD; in 2006, Barron et al. used the Spot-o-Matic ...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F30/23
CPCG06F30/23
Inventor 陈凡胜胡琸悦钟篱苏晓锋唐玉俊
Owner SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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