High-thickness low-defect six-inch silicon carbide crystal growth method conforming to industrial production
A crystal growth, low defect technology, applied in the direction of crystal growth, single crystal growth, single crystal growth, etc., can solve the problems of easy change of crystal form, many crystal defects, low single furnace output and so on
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[0032] Take the growth of a six-inch silicon carbide single crystal as an example. Put the assembled thermal field system and crucible growth system into the intermediate frequency furnace; close the furnace cover of the intermediate frequency induction furnace, evacuate the furnace to below 1E-4pa at room temperature, and then heat the furnace to 1000°C with low power , and then filled with argon to 80,000 Pa, and then pumped out the filled argon, and then filled with argon again to 80,000 Pa, and then pumped out the filled argon to a vacuum below 1E-4Pa, and then filled with argon to The pressure was controlled to 40,000 Pa, and the power was turned on for slow heating to 2000°C. After maintaining the temperature at 2000°C for 1 hour, the furnace pressure decreased exponentially to 1500Pa.
[0033] After keeping the temperature at 2000°C and the pressure at 1500pa for 10 hours, the furnace pressure was reduced to 800pa exponentially, and the temperature was raised to 2200°C ...
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