Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Magnetic-field-point-free magnetic nanoparticle imaging method based on hysteresis effect

A technology of magnetic nanoparticles and hysteresis effect, applied in the field of magnetic nanoparticle imaging, can solve problems such as obvious hysteresis effect, image artifacts and deviations, increase induced voltage, reduce artifacts and phase errors, and enhance reconstruction The effect of image effects

Active Publication Date: 2021-10-29
BEIHANG UNIV
View PDF11 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, in practical applications, when the particle size of SPIO particles is less than 14nm, the hysteresis effect of the particles is very small and negligible; but when the particle size is larger than 14nm, the hysteresis effect of the particles is obvious. The image reconstruction algorithm based on the Langevin magnetization curve The basic assumption is no longer satisfied, and the reconstructed image has artifacts and deviations

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Magnetic-field-point-free magnetic nanoparticle imaging method based on hysteresis effect
  • Magnetic-field-point-free magnetic nanoparticle imaging method based on hysteresis effect
  • Magnetic-field-point-free magnetic nanoparticle imaging method based on hysteresis effect

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0040] The present invention will be described in further detail below in conjunction with accompanying drawings and examples.

[0041] A magnetic field-free point magnetic nanoparticle imaging method based on hysteresis effect, comprising the following steps:

[0042] Step S1: Measure the parameters by magnetic particle spectrometer, and then combine the M-H curve model of hysteresis effect to obtain the hysteresis loop of SPIO;

[0043] In the MPI device, SPIO is excited by a high-frequency (20-45kHz) sinusoidal excitation magnetic field, and the magnetization process of SPIO follows the M-H hysteresis curve model:

[0044]

[0045] Among them, H is the external excitation magnetic field, M is the magnetization vector of SPIO, μ 0 is the vacuum permeability. In the model of formula (1.1), when the external magnetic field increases positively, δ=1; when the external magnetic field decreases reversely, δ=-1. Through Magnetic Particle Spectrometer (MPS), three sets of dat...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a magnetic-field-point-free magnetic nanoparticle imaging method based on a hysteresis effect. The method comprises the following steps: obtaining a hysteresis loop model of a superparamagnetic nanoparticle (Superparamagnetic Iron Oxide Nanoparticles, SPIO); carrying out calculating based on a sine excitation magnetic field and the hysteresis loop model of the SPIO, so as to obtain a point spread function (PSF) of the SPIO; acquiring an original reconstructed image of field free point-magnet particle imaging (FFP-MPI) based on a field free point (FFP) moving track and a voltage signal; and carrying out deconvolution on the PSF considering the hysteresis effect of the original image, thereby obtaining a final reconstructed image. According to the method, artifacts and phase errors generated by the hysteresis effect of the large-particle-size SPIO on image reconstruction are reduced, the defect of the traditional reconstruction method that reconstruction is carried out by ignoring the hysteresis effect is overcome, the reconstruction speed and resolution are greatly improved, and the application range of the SPIO is widened.

Description

technical field [0001] The invention belongs to the field of magnetic nanoparticle imaging, and in particular relates to a magnetic field-free point magnetic nanoparticle imaging method based on a hysteresis effect. Background technique [0002] Magnetic particle imaging (Magnetic Particle Imaging, MPI) is a new type of imaging method, which creates a field free point (Field Free Point, FFP) or a field free line (Field Free Line, FFL) Superparamagnetic Iron Oxide Nanoparticles (SPIO) in the line region respond to the excitation magnetic field, while the SPIOs in other regions are in a magnetic saturation state and do not respond to the excitation magnetic field, so as to achieve the purpose of spatial encoding and reconstruction of the magnetic particle distribution information, thereby Precise positioning of detection objects such as tumors. MPI has the characteristics of high temporal resolution, high spatial resolution, and no harmful radiation, which makes it have a goo...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): A61B5/0515
CPCA61B5/0515G01R33/1276G01R33/14Y02A90/30G01R33/24
Inventor 田捷李怡濛惠辉张鹏杨鑫
Owner BEIHANG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com