Method for measuring content of residual metal elements in OLED (Organic Light Emitting Diode) material

A technology of metal element content and metal element, applied in the field of detection, can solve the problems of poor detection results, inaccurate reproducibility, etc., and achieve the effect of high accuracy, small background blank, and low detection limit

Active Publication Date: 2022-03-15
SICHUAN AG RAY NEW MATERIALS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, in practical applications, it is found that the description of reagent selection, sample preparation and processing is vague, and the standard method is completely copied to test OLED materials, which may give an inaccurate or poorly reproducible test result.

Method used

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  • Method for measuring content of residual metal elements in OLED (Organic Light Emitting Diode) material
  • Method for measuring content of residual metal elements in OLED (Organic Light Emitting Diode) material
  • Method for measuring content of residual metal elements in OLED (Organic Light Emitting Diode) material

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Experimental program
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Embodiment 1

[0046] Step 1: Preparation of standard solution:

[0047] Draw 1ml from Ge,In,Re,Rh,Sc,Y multi-element standard solution 3 into a 50ml PFA volumetric flask, use 10% nitric acid to dilute to get 2μg / ml Ge,In,Re,Rh,Sc,Y Element standard solution mother solution, as internal standard solution;

[0048] Draw 0.5ml from multi-element standard solution 1 and multi-element standard solution 2 into 50ml PFA volumetric flasks respectively, and use 10% nitric acid to obtain a mixed multi-element standard solution of 10μg / ml. Pipette 0.5ml, 2.5ml, 5ml, 25ml into four different 50ml PFA volumetric flasks, and dilute with 10% nitric acid to obtain 0.1μg / ml, 0.5μg / ml, 1μg / ml, 5μg / ml mixed multi-element Standard solution mother solution, draw 0.5ml from the mixed multi-element standard solution mother solution of 1μg / ml and 5μg / ml respectively to two different 50ml PFA volumetric flasks, dilute to the volume with 10% nitric acid to obtain 0.01μg / ml, 0.05μg / ml ml of mixed multi-element stan...

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Abstract

The invention discloses a method for measuring the content of residual metal elements in an OLED (Organic Light Emitting Diode) material, and particularly relates to a pretreatment method of extracting a sample by adopting an organic solvent and acidizing and ultrasonically extracting, and a single quadrupole inductively coupled plasma mass spectrometer provided with an organic sampling system is used for detecting. Compared with a conventional dry digestion and acid digestion pretreatment method, the method has the characteristics of rapid pretreatment, less process interference, low detection limit, small background blank, good precision, high accuracy and environmental friendliness in operation.

Description

technical field [0001] The invention belongs to the technical field of detection, and in particular relates to a method for measuring the content of residual metal elements in OLED materials. Background technique [0002] Organic light-emitting diode displays are widely used in daily life, such as smartphones, tablets, TVs, and car displays, due to their advantages such as self-illumination, low power consumption, wide viewing angle, high contrast, fast response, and gentleness to human eyes. [0003] Residual metal elements refer to inorganic substances that cannot be completely removed during the production process. In OLED material quality standards, the content of residual metal elements is an important control index. It is a luminescent trap, which affects the stability of the device, and even causes the device to fail, affecting the industrial application of the material. [0004] For the detection methods of residual metal elements, the existing national standards an...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N1/28G01N1/38G01N1/40G01N21/73
CPCG01N1/28G01N1/38G01N1/4055G01N21/73G01N2001/4061Y02P10/20
Inventor 陈景生潘统很戴雷蔡丽菲
Owner SICHUAN AG RAY NEW MATERIALS CO LTD
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