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Desktop type device and method for sample thickness in-situ measurement under static high pressure

A technology of sample thickness and high-voltage device, which is applied in the direction of measuring device, wave/particle radiation, image analysis, etc., can solve the problems of complicated operation, high experimental cost, and large space occupation, and achieve simple operation and no use cost , the effect of reducing uncertainty

Active Publication Date: 2022-07-05
INST OF FLUID PHYSICS CHINA ACAD OF ENG PHYSICS
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Problems solved by technology

However, due to the dependence on synchrotron radiation X-rays, this method can only be used in large-cavity presses built on the basis of synchrotron radiation light sources, and cannot be popularized on large-cavity high-pressure devices in other laboratories
[0004] Therefore, the on-site measurement device and method of sample thickness in the traditional high-pressure sound velocity experiment have problems such as high experimental cost, large space occupation, and complicated operation and use.

Method used

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  • Desktop type device and method for sample thickness in-situ measurement under static high pressure
  • Desktop type device and method for sample thickness in-situ measurement under static high pressure
  • Desktop type device and method for sample thickness in-situ measurement under static high pressure

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Embodiment 1

[0052] like Figure 1 to Figure 4 As shown, the present invention is a desktop device for in-situ measurement of sample thickness under static high pressure. The present invention uses a microfocus X-ray machine to replace the synchrotron radiation light source in the traditional scheme to measure the sample thickness in the high-pressure sound velocity experiment on-site, and at the same time By changing the overall layout of each component in the device, and in combination with the measurement method proposed by the present invention, measurement accuracy basically equivalent to that of the synchrotron radiation light source solution can be achieved at a low cost.

[0053] like figure 2 As shown, the device includes a control computer 1, a microfocus X-ray machine 2, a large cavity high-voltage device 3, an X-ray image detector 4, an X-ray machine displacement system 5, a detector displacement system 6 and a vibration isolation optical platform 7;

[0054] The microfocus X...

Embodiment 2

[0076] like Figure 5 As shown, the difference between this embodiment and Embodiment 1 is that this embodiment provides a method for in-situ measurement of sample thickness under static pressure, and this method is applied to the described method for in-situ measurement of sample thickness under static pressure the desktop device; the method comprising:

[0077] Carry out the layout setting of each system in the desktop device for in-situ measurement of sample thickness under static pressure;

[0078] Scan the Z-axis position of the microfocus X-ray machine 2, and collect a projected image of the sample at each position;

[0079] Fitting the position of the upper and lower surfaces of the sample to be tested in the projection image, and measuring the number of pixels occupied by the sample to be tested, the thickness of the sample to be tested is obtained;

[0080] Determine the minimum thickness of the sample to be measured according to the Z-axis position of the microfocu...

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Abstract

The invention discloses a desktop type device and method for in-situ measurement of the thickness of a sample under static high pressure, and relates to the technical field of in-situ measurement of the thickness of the sample in a high-pressure sound velocity experiment. The device comprises a control computer, a micro-focus X-ray machine, a large-cavity high-pressure device, an X-ray image detector, an X-ray machine displacement system, a detector displacement system and a shock insulation optical platform, the micro-focus X-ray machine is mounted on the X-ray machine displacement system, and the X-ray image detector is mounted on the detector displacement system; a to-be-tested sample is placed in an anvil of the large-cavity high-pressure device; the X-ray machine displacement system, the large-cavity high-pressure device and the detector displacement system are horizontally mounted on the shock insulation optical platform in sequence; and each subsystem is connected with a control computer through a cable for remote control and data transmission. Compared with a traditional scheme based on a synchrotron radiation light source, the experiment cost and space are greatly reduced, operation and use are easy, and popularization to common small laboratories is facilitated.

Description

technical field [0001] The invention relates to the technical field of in-situ measurement of sample thickness in high-pressure sound velocity experiments, in particular to a desktop device and method for in-situ measurement of sample thickness under static high pressure. Background technique [0002] Understanding the mechanical properties and physical laws of materials under high pressure is of great significance to the study of geophysics, petroleum exploration, mineral formation, and synthesis of new materials. The macroscopic and microscopic properties of materials such as elastic modulus, shear modulus, and crystal structure phase transition can be determined according to the sound speed. Therefore, the measurement of sound speed plays a very important role in the experimental research of materials under high pressure. The piezoelectric ultrasonic method is usually used for the measurement of the speed of sound (hereinafter referred to as the high-pressure sound speed)...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B15/02G06T7/60G06T7/80
CPCG01B15/02G06T7/80G06T7/60G06T2207/10116Y02E30/30
Inventor 谭伯仲何强阳庆国
Owner INST OF FLUID PHYSICS CHINA ACAD OF ENG PHYSICS
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