Method for testing SEM and TEM by collecting fine particulate matters through TGDSC

A technology for fine particles and samples, applied in particle and sedimentation analysis, weighing by removing certain components, measuring devices, etc., can solve problems such as difficult fine particle emission modes and fine particles that do not directly correspond

Pending Publication Date: 2022-07-22
CHONGQING UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Moreover, it usually takes a certain amount of time to collect fine particles in the atmosphere, which leads to the fact that the composition of fine particles collected in the atmosphere may have changed before detection, and the fine particle samples obtained may not be the same as those produced by the original emission source. directly corresponding
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  • Method for testing SEM and TEM by collecting fine particulate matters through TGDSC
  • Method for testing SEM and TEM by collecting fine particulate matters through TGDSC

Examples

Experimental program
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Effect test

Embodiment 1

[0040] A method for testing SEM and TEM by collecting fine particles by TGDSC, by installing a gas sampling clip containing a gas filter membrane on the pipe at the gas outlet of the TGDSC instrument, and then passing a single crystal silicon wafer and a copper mesh with a carbon membrane through both sides The glue is fixed on the filter membrane; with the start of the TGDSC experiment, when the heating temperature reaches the combustion temperature, decomposition temperature or melting temperature of the sample, the sample will escape gas and fine particles to the surrounding, and the generated escape gas and fine particles will The carrier gas for thermal analysis is brought into the thermal analysis outlet pipe and passes through the gas sampling clip. Since the size of the fine particles generated by the sample is larger than the size of the gas molecules, the fine particles cannot penetrate the filter membrane and pass through the gas sampling clip, and will be deposited o...

Embodiment 2

[0042] A method of collecting fine particles by TGDSC to test SEM and TEM, thermal analysis (TGDSC) experiments can be continuously fed with argon, nitrogen or air and other gases, and the heating rate can be changed to obtain a series of physical phenomena that occur in the sample as the temperature changes. Chemical reactions, the research methods of TGDSC cover almost all kinds of carbon materials, polymers, metals, and silicate materials. When the sample is heated to a certain temperature, the sample will undergo combustion and decomposition reactions, resulting in weight loss of the sample. The weight loss is due to the reaction process. Gas will escape from the original sample, and with the escape of gas, it will take away a large number of particles with different particle sizes. The composition of the gas is detected to determine what gas will be generated during the heating process of the sample, so as to grasp the high-temperature reaction mechanism of the sample. The...

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Abstract

The invention discloses a method for testing SEM (scanning electron microscope) and TEM (transmission electron microscope) by collecting fine particulate matters through TGDSC, which comprises the following steps: step 1, installing a gas sampling clamp containing a gas filter membrane on a pipeline of a gas outlet of a TGDSC instrument, and then fixing a monocrystalline silicon wafer and a copper mesh with a carbon membrane on the filter membrane through a double faced adhesive tape; according to the invention, many experiment parameters can be changed in the TGDSC experiment process, so that the temperature range, the sample amount, the heating rate, the gas type, the atmosphere and the gas flow of the sample can be adjusted, and the TGDSC experiment can be carried out by changing the chemical components of the sample to obtain thermal reaction processes under different experiment conditions; meanwhile, the fine particulate matters in the corresponding reaction process can be collected for SEM and TEM analysis, and finally combustion dynamics and a fine particulate matter generation rule are established, so that an effective laboratory solution is provided for controlling the generation of the fine particulate matters.

Description

technical field [0001] The invention relates to the technical field of fine particle testing, in particular to a method for collecting fine particles by TGDSC to test SEM and TEM. Background technique [0002] Fine particles are also called fine particles, fine particles, and PM2.5. Fine particulate matter refers to particulate matter with aerodynamic equivalent diameter less than or equal to 2.5 microns in ambient air. It can be suspended in the air for a long time, and the higher its concentration in the air, the more serious the air pollution is. Although fine particulate matter is only a small component in the composition of the earth's atmosphere, it has important effects on air quality and visibility. The fine particles have small particle size, long residence time in the atmosphere and long transportation distance. People breathe a lot of air every day, and particles with a diameter of 10 μm in the air are usually deposited in the upper respiratory tract of people,...

Claims

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Application Information

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IPC IPC(8): G01N5/04G01N15/02G01N23/04G01N23/2202G01N23/2206G01N23/2251
CPCG01N5/04G01N15/0205G01N15/0255G01N15/0272G01N23/2202G01N23/2206G01N23/2251G01N23/04G01N2015/025G01N2015/0294G01N2223/635
Inventor 余亮张露贾佳琦韩富年卢有余汪然
Owner CHONGQING UNIV
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