Process for preparing vanadium oxide film
A technology of vanadium oxide film and oxygen, which is applied in the field of information science and technology, can solve the problems of vanadium oxide film damage, reduce method repeatability, and reduce the phase transition characteristics of vanadium oxide film
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Embodiment 1
[0028] (1) Purpose of the method: to prepare a vanadium oxide thin film with a high temperature coefficient of resistance, which is used as a heat-sensitive thin film material for an uncooled infrared detector.
[0029] (2) Substrate material: Si
[0030] (3) Preparation process:
[0031] ①Clean the substrate. Use standard semiconductor cleaning methods to clean the substrate, clean the substrate and dry it for later use.
[0032] ② Sputtering vanadium film. Open the vacuum chamber, put in the Si substrate, first draw a low vacuum, and then open the high valve to draw a high vacuum. After the high vacuum reaches the predetermined value, it is filled with argon to reach the working pressure. Turn on the parallel source, first clean the Si substrate with a parallel ion beam, then turn off the parallel source, turn on the focus source, and clean the target. After cleaning, open the baffle and start sputtering coating. The method parameter list of sputter coating is shown in ...
Embodiment 2
[0039] (1) The purpose of the method: to prepare a vanadium oxide film with high phase change characteristics, which is used for phase change micro-optical sensors
[0040] (2) Substrate material: Si 3 N 4
[0041] (3) Preparation process: The preparation process is basically the same as that of Example 1, but the method parameters are slightly different.
[0042] Table 4 and Table 5 are respectively the method parameter table of this implementation example
[0043] background vacuum
-3 Pa
2×10 -2 Pa
Ion beam energy (cleaning substrate)
500eV
Screen current (cleaning substrate)
40mA
ion beam energy
800eV
screen current
70mA
Coating time
10min
Substrate temperature
250℃
[0044] Reactive gas
Ar, O2
gas flow ratio
1∶2
Argon flow
60 grids
oxidation temperature
400℃
oxidation time
90min
...
Embodiment 3
[0048] (1) Purpose of the method: to prepare a vanadium oxide film with a high temperature coefficient of resistance for infrared detectors
[0049] (2) Substrate material: Si 3 N 4
[0050] (3) Preparation process: The preparation process is basically the same as that of Example 1, but the oxidation annealing parameters are slightly different.
[0051] Reactive gas
PUM
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