Method to manufacture silicon quantum islands and single-electron devices
a manufacturing method and technology for semiconductor devices, applied in the field of manufacturing semiconductor devices, can solve the problems of not being able to scale down conventional devices straightforwardly, the implementation of single-electronic devices has yet to be realized, and the practical implementation of single-electronic devices to mass
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[0045]Selected data to illustrating the fabrication and evaluation of a test device are presented to demonstrate various methods and beneficial features of the invention.
[0046]A commercial sample of SOI substrate (standard UNIBOND™ from Silicon On Insulator Technologies, Bernin, France), having crystalline silicon layer average thickness of ˜500 Angstrom and buried oxide layer average thickness of ˜4000 Angstrom thick layer, was used as the starting substrate. A selected portion of the crystalline silicon layer was isolated and thinned to a thickness of 50 to 100 Angstroms via sacrificial oxidation. This was achieved by performing a blanket sacrificial oxidation of the silicon to reduce its thickness, standard processing to form the gate and sidewalls, and then followed by selective epitaxial growth (SEG) to define the source drain electrodes. As part of the SEG, SOI wafers were subjected to a high-temperature pre-SEG clean process that caused the thinned silicon to agglomerate into...
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