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7 results about "Available light" patented technology

In photography and cinematography, available light or ambient light refers to any source of light that is not explicitly supplied by the photographer for the purpose of taking photos. The term usually refers to sources of light that are already available naturally (e.g. the sun, moon, lightning) or artificial light already being used (e.g. to light a room). It generally excludes flashes, although arguably flash lighting provided by other photographers shooting simultaneously in the same space could be considered available light. Light sources that affect the scene and are included in the actual frame are called practical light sources, or simply practicals.

Semitransparent SiC sheet defect detection system and method based on multi-light-source cooperation

The invention discloses a semitransparent SiC wafer defect detection system and method based on multi-light-source cooperation, and relates to the technical field of product defect analysis. Light sources are divided into a template light source and a non-template light source, SiC wafer features detected by the light sources are called, a template light source database is established, the limiting conditions of the template light sources for available light sources are analyzed based on the template light source database, and the defect detection result of the semitransparent SiC wafer is obtained. The method comprises the following steps: establishing a limiting characteristic range database according to a limiting condition, when receiving a defect detection task for a current batch of SiC chips, judging a matching relationship between a template light source and the current batch of SiC chips, obtaining a to-be-selected light source of the current batch of SiC chips according to the matching relationship, selecting a detection light source by considering a historical defect misjudgment rate, and when the to-be-selected light source of the current batch of SiC chips does not exist, selecting the detection light source according to the historical defect misjudgment rate. According to the method, the optimal light source is dynamically selected based on the actual detection effect, and a reliable basis is provided for subsequent quality control and processing.
Owner:南京宽能半导体有限公司

Mixed-halide perovskite spectra generators

ActiveUS12595887B2Electrical apparatusFixed installationFilm baseExcitation pattern
A system may include a first emitter that includes a first mixed halide perovskite film that includes a first type mixed halide perovskite material that possesses a first usable photoemission wavelength range. The system may include a first excitation device that is positioned adjacent to the mixed halide perovskite film based on an excitation mode of the first excitation device. The first excitation device is configured to tune, based on a first instruction, the first mixed halide perovskite film to emit a first photoemission peak within the first usable photoemission wavelength range, and tune, based on a second instruction, the first mixed halide perovskite film to emit a second photoemission peak within the first usable photoemission wavelength range. The second photoemission peak has at least one of a different width or center within the first usable photoemission wavelength range than the first photoemission peak.
Owner:ANTHONY RUTH CONSULTING LLC

Method and device for calibrating camera by observing far target

The invention discloses a method and a device for calibrating a camera by observing a far target. The method comprises the following steps: S1, determining a principal point coordinate of the camera according to a characteristic that an image of a line segment coinciding with an optical axis on the camera is a principal point; s2, in combination with celestial body observation, acquiring real field angles of at least two remote targets relative to the optical center of the camera; s3, solving the focal length of the camera based on the principal point coordinates and the real field angle; and S4, gradually expanding from a distortion known region in the center of the pixel plane, and solving the full-pixel plane distortion characteristic of the camera. The required equipment is simple, and the cost is low; wherein the far target can be simulated by an optical method, so that the target identification degree is improved and the calibration field is reduced. The calibration process is carried out step by step, large-scale parameter optimization and falling into local minimum are avoided, and the reliability of the calibration result is improved.
Owner:XIAMEN UNIV

LiFi non-inductive switching method and system based on WiFi protocol stack

The embodiment of the invention discloses a LiFi non-inductive switching method and system based on a WiFi protocol stack, and the method comprises the steps: receiving a downlink optical signal broadcasted by a plurality of LiFi light sources, carrying out the conversion and demodulation, extracting a serial number and signal intensity, carrying out the analysis, building an available light source list, and when the signal intensity of the currently connected LiFi light source is detected to be lower than a preset threshold value, carrying out the switching of the LiFi light source. And selecting the LiFi light source with the maximum signal intensity from the available light source list as a target light source, packaging an association request comprising the MAC address of the terminal and the serial number of the target light source through a WiFi protocol stack, modulating the association request into an uplink light signal, and sending the uplink light signal to the target light source. Automatic non-inductive switching of the terminal among the multiple LiFi light sources is achieved through the WiFi protocol stack, and the problems that in the prior art, switching delay is large, the system development cost is high, and compatibility with existing wireless communication equipment is poor are solved.
Owner:SHENZHEN HUACHUANGXINGUANG TECH CO LTD

LCOS projection system

The invention relates to the field of projection systems, and discloses an LCOS projection system which is composed of an illumination assembly with a light source, a polarization assembly used for transmitting P polarized light and reflecting S polarized light, and a reflector used for reflecting light back to the polarization assembly, which are sequentially arranged along the direction of an optical axis, the LCOS chip is used for enabling available light to carry image information and modulating P polarized light into S polarized light, and the projection objective lens is arranged on the light outlet side of the polarization assembly. Wherein the projection objective lens comprises a first lens made of a glass material, a second lens made of a plastic material, a third lens made of a plastic material and a fourth lens made of a plastic material which are sequentially arranged from a light emitting side to a light incident side; a fifth lens made of a plastic material is selectively arranged on the light incident side of the fourth lens; the reflecting mirror is a concave mirror, and the reflecting mirror is used for reflecting out light in a parallel mode.
Owner:AAC OPTICS (CHANGZHOU) CO LTD

Light source module for EUV light, EUV collector mirror and aperture insert therefor

A light source module (2) for EUV light has one or more pump light sources (27) to produce pump light (26), an EUV collector mirror(22), an obscuration structure (30) for shielding the EUV optics from the pump light (26), and a mounting rod (31) for mounting the obscuration structure (30) between the primary focus (PF) and the intermediate focus (IF). The EUV collector mirror (22) has a reflection surface (23) having a primary focus (PF) and an intermediate focus (IF) for reflecting usable EUV light, which impinges on the reflection surface (23) from a source region (24) around the primary focus (PF), to a subsequent EUV optics beyond the intermediate focus (IF), and an inner aperture (29) for the pump light (26). The obscuration structure (30) is configured not to block any light path originating in the primary focus (PF) and being reflected by the reflection surface (23) towards the intermediate focus (IF).
Owner:CARL ZEISS SMT GMBH +1