Realizing method of novel enhancement type AlGaN/GaN HEMT device
An implementation method and enhanced technology, applied in the field of microelectronics, can solve the problems of device performance and reliability impact, insufficient threshold voltage, low threshold voltage, etc., and achieve high device reliability, high depletion rate, and low cost.
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[0034] see figure 1 , which is a schematic cross-sectional structure diagram of the single-gate enhanced AlGaN / GaN HEMT device completed in Embodiment 1 of the present invention. In this embodiment, a 0001-plane sapphire substrate is selected as the growth substrate, and a single-gate enhanced AlGaN / GaN HEMT device is prepared according to the following process:
[0035] 1. Put the sapphire substrate in the reaction chamber of the metal organic chemical vapor deposition MOCVD equipment, and pump the vacuum degree of the reaction chamber to 1×10 -2 Under Torr, the sapphire substrate is subjected to high-temperature heat treatment and surface nitriding under the protection of a mixed gas of hydrogen and ammonia. The heating temperature is 1050°C, the heating time is 5min, the pressure of the reaction chamber is 40Torr, and the flow rate of hydrogen gas is 1500sccm. Ammonia flow rate is 1500sccm;
[0036] 2. Lower the substrate temperature to 500°C, keep the growth pressure at ...
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