Method for growing AlN and AlGaN on InAlN buffer layer
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- THE 13TH RES INST OF CHINA ELECTRONICS TECH GRP CORP
- Publication Date
- 2009-01-14
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Abstract
Description
technical field
[0001] The invention relates to a method for growing AlN and AlGaN on an InAlN buffer layer, and belongs to the field of nitride-based material growth and device fabrication. Background technique
[0002] Due to the wide bandgap, low dielectric constant, high temperature resistance, corrosion resistance, and radiation resistance of nitride materials, they are very suitable for making radiation-resistant, high-frequency, high-power, and high-density integrated electronic devices. In terms of optoelectronic devices, nitride materials also have excellent performance. First of all, GaN does not absorb visible light, and the ultraviolet detector made of it can be blinded to visible light, does not require a filter system, and does not need to be made into a shallow junction, which can greatly improve Quantum efficiency, now GaN-based ultraviolet detectors have begun to commercialize; secondly, AlGaN with a high Al composition greater than 50% can achieve solar bli...