Preparation method of low-resistance p-GaN ohmic contact electrode
Patent Information
- Authority / Receiving Office
- CN Β· China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
- Publication Date
- 2012-04-25
- Estimated Expiration
- Not applicable Β· inactive patent
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Abstract
Description
technical field
[0001] The invention relates to the technical field of semiconductor technology, in particular to a method for preparing a low-resistance p-GaN ohmic contact electrode in a semiconductor optoelectronic device. Background technique
[0002] As a representative of the third-generation semiconductor material, the direct bandgap semiconductor material GaN can form a continuously variable ternary or quaternary solid solution alloy (AlGaN, InGaN, AlInGaN) with InN, AlN, etc., and the corresponding wavelength covers The range from red light to near-ultraviolet light; and it has excellent characteristics such as good chemical stability and thermal stability, so it has great application prospects in the fields of optoelectronics and microelectronics.
[0003] In terms of microelectronics, because the GaN material series has high thermal conductivity and high breakdown field strength, it is very suitable for high-temperature high-power electronic devices and high-frequ...